Piezo Material Characterization Techniques with Atomic Force Microscope (AFM)  Event

Date Posted : 15 Sep 2020

Event Date  :   29 Sep 2020 - 29 Sep 2020
Event Venue  :   @Online Webinar

Event Details:
Date: 29th September 2020
Time: 10:00am GMT+8 MY/SG/HK
Register here: https://register.gotowebinar.com/register/6436046698226841357

Agenda

Piezoresponse Force Microscopy in Functional Materials Research
by Dr. Chang Wei Sea, Monash University Malaysia

Piezoresponse force microscopy (PFM) has become an important technique in the study
of electromechanical coupling effect in various materials. PFM is also a mainstream
technique in the field of ferroelectric, piezoelectric and multiferroic materials, advancing
our understanding of polarization switching, domain wall dynamics, piezoelectric
coefficients, and energy dissipation through local physical characteristics. Here, we
review the versatility and wide applicability of PFM in materials engineering, and its
significance impact in emerging functional properties of advanced oxide, hybrid and
nanoferroic materials.

Piezo Material Characterization with Atomic Force Microscope.
by Dr. Chen Yun, Bruker

The piezoelectric materials, with their unique electromechanical coupling, have been
developing into an important research field in material science, and have been widely
used in electromechanical and electrooptical devices. With the prosperity in
piezoelectricity study of nanomaterials, especially 2D materials, and the dimension
shrinkage of ferroelectric devices, the traditional macroscopic Polarization-Electric Field
methods can no longer fulfill the emerging requirements on characterization and
manipulation at the domain level. Piezoresponse force microscope (PFM), with its
remarkable spatial resolutions and sensitivity, provides a useful tool for exploring
piezoelectric properties in the nanoscale.
Within this webinar session, we will briefly explain the working principle of PFM. And then
with some practical examples, we will demonstrate how PFM help i) reveal the
domain structure (domain imaging), ii) manipulate the polarization of individual domains
(domain writing), and iii) provide direct insight into the dynamic process of polarization
change (PFM spectroscopy). Last but certainly not the least, we will discuss recent PFM
developments in pursuing the more sensitive and quantitative characterization of
piezoelectric materials.