• Piezo Material Characterization Techniques with Atomic Force Microscope (AFM) 

    Date Posted : 15 Sep 2020

    Event Date  :   29 Sep 2020 - 29 Sep 2020
    Event Venue  :   @Online Webinar

    Event Details:
    Date: 29th September 2020
    Time: 10:00am GMT+8 MY/SG/HK
    Register here: https://register.gotowebinar.com/register/6436046698226841357


    Piezoresponse Force Microscopy in Functional Materials Research
    by Dr. Chang Wei Sea, Monash University Malaysia

    Piezoresponse force microscopy (PFM) has become an important technique in the study
    of electromechanical coupling effect in various materials. PFM is also a mainstream
    technique in the field of ferroelectric, piezoelectric and multiferroic materials, advancing
    our understanding of polarization switching, domain wall dynamics, piezoelectric
    coefficients, and energy dissipation through local physical characteristics. Here, we
    review the versatility and wide applicability of PFM in materials engineering, and its
    significance impact in emerging functional properties of advanced oxide, hybrid and
    nanoferroic materials.

    Piezo Material Characterization with Atomic Force Microscope.
    by Dr. Chen Yun, Bruker

    The piezoelectric materials, with their unique electromechanical coupling, have been
    developing into an important research field in material science, and have been widely
    used in electromechanical and electrooptical devices. With the prosperity in
    piezoelectricity study of nanomaterials, especially 2D materials, and the dimension
    shrinkage of ferroelectric devices, the traditional macroscopic Polarization-Electric Field
    methods can no longer fulfill the emerging requirements on characterization and
    manipulation at the domain level. Piezoresponse force microscope (PFM), with its
    remarkable spatial resolutions and sensitivity, provides a useful tool for exploring
    piezoelectric properties in the nanoscale.
    Within this webinar session, we will briefly explain the working principle of PFM. And then
    with some practical examples, we will demonstrate how PFM help i) reveal the
    domain structure (domain imaging), ii) manipulate the polarization of individual domains
    (domain writing), and iii) provide direct insight into the dynamic process of polarization
    change (PFM spectroscopy). Last but certainly not the least, we will discuss recent PFM
    developments in pursuing the more sensitive and quantitative characterization of
    piezoelectric materials.

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