• (1) AFM / SCANNING MODE / HIGH RESOLUTION
    PeakForce Tapping®

    PeakForce Tapping - How AFM Should Be
    Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high-resolution imaging, extends AFM measurements into a range of samples not previously accessed, and uniquely enables simultaneous nanoscale property mapping.

    Highest resolution imaging
    PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials. PeakForce Tapping routinely resolves subunits in individual molecules, the kind of resolution that used to be thought of as only possible with scanning tunneling microscopy (STM).

    Unique, quantitative results, whatever you measure
    PeakForce Tapping’s piconewton (pN) force sensitivity simultaneously and uniquely combines the highest resolution AFM imaging with quantitative, nanoscale electrical, mechanical, biological, and chemical property mapping, enabling researchers of all experience levels to make new discoveries.

    Easy to use, making every user an AFM expert
    PeakForce Tapping’s linear force control provides the user with unmatched AFM ease of use with the intelligent ScanAsyst® image optimization software, and the low forces preserve the probe shape for longer life and more consistent imaging.

    Featured on the following Bruker AFMs:
    • Dimension FastScan®
    • Dimension FastScan Bio™
    • Dimension Icon®
    • Dimension Icon-Raman™
    • BioScope Resolve™
    • MultiMode® 8
    • Dimension Edge™

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/modes/modes/imaging-modes/peakforce-tapping/overview.html

  • (1) STYLUS PROFILER
    Dektak XT

    The Gold Standard in Stylus Profilometry

    The DektakXT® stylus profiler features a revolutionary design that enables unmatched repeatability of 4Å and up to 40% improved scanning speeds. This major milestone combined with its other breakthroughs, uniquely enable the DektakXT to perform the critical nanometer-level film, step and surface measurements needed to power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets.

    Over Forty Years of Profiling Innovation
    The Dektak brand boasts the first profiler for thin film measurements, the first microprocessor-based profiler, the first profiler with 3D capability, the first PC-based profiler, and the first automated 300mm profiler. Now, DektakXT continues this legacy of pioneering “firsts” as the first stylus profiler to implement a single-arch design, the first to incorporate a true-color HD optical camera, and the first to harness 64-bit parallel processing architecture to achieve optimal measurement and operating efficiency.

    Speeding Up Collection and Analysis
    Utilizing a unique direct-drive scan stage, the DektakXT accelerates measurement scan times by 40% while maintaining industry-leading quality. Vision64, Bruker’s 64-bit parallel processing operation and analysis software, enables faster loading of 3D files and faster applications of filters and multiscan database analyses.

    Delivering Repeatable Measurements
    Implementing a single-arch structure makes the DektakXT sturdier, which reduces sources of environmental noise. DektakXT’s upgraded “smart electronics” reduce temperature variations and employ modern processors that minimize error-inducing noise, allowing it to be an even more robust system capable of measuring <10nm step heights.

    Perfecting Operation and Analysis
    Bruker’s Vision64 software complements DektakXT’s innovative design by providing the most intuitive and streamlined visual user interface. The combination of intelligent architecture and customizable automation capabilities allow for fast and comprehensive data collection and analysis. Whether you’re using a recipe to perform routine analysis on single scans, or applying custom filters settings and calculations, DektakXT’s Data Analyzer displays current data while also revealing other possible analyses.

    Making Things Easy
    The DektakXT’s self-aligning styli and assembly allows the user to quickly and easily change stylus tip size while eliminating any potential mishaps during the process. Bruker offers the widest range of stylus sizes to accommodate nearly any application need.

    Ensuring High Yield
    DektakXT provides the ability to quickly and easily set up and run automated multi-site measurement routines to verify the precise thickness of thin films across the wafer surface with unmatched repeatability. This close monitoring can save valuable time and money by improving yields.

    Unmatched performance and better than 4Å repeatability
    The Dektak XT features an innovative single-arch design that delivers breakthrough platform stability. This is combined with leading-edge "smart electronics" that establish a new low-noise benchmark for stylus profiling. Finally, the Dektak XT’s new hardware configuration offers 40% shorter collection times than prior generations.

    Unprecedented efficiency and ease of use
    The Dektak XT is equipped with Bruker’s intuitive Vision64™ user interface, which simplifies workflow and operation to make the profiler easier than ever to use for advanced analysis. In addition, the system’s self-aligning styli enables effortless tip exchange, while the profiler’s single sensor design enables the widest range of capabilities in a single platform.

    Incomparable value from the world leader in stylus profilers
    In addition to premier performance in an affordable package, the Dektak XT is available with the full complement of accessories to extend versatility and tailor the system to your specific application.
    Building on the knowledge and experience from more than forty years of stylus profiling innovations, the Dektak XT incorporates a powerful combination of industry firsts, including a unique single-arch design and smart electronics for unmatched repeatability and performance, HD true color camera for enhanced image resolution and clarity, and a 64-bit parallel processing software architecture.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/stylus-profilometers/dektak-xt/overview.html

  • (1) TRIBOLOGY / MECHANICAL TESTING
    UMT TriboLab

    The Most Versatile Tribology System Ever Designed

    Comprehensive materials testing for mechanical and triobological properties
    Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance.

    In fact, the UMT TriboLab offers higher speeds, more torque, and better force measurement than any of its predecessors or competitors, plus it introduces powerful new features for improved efficiency and ease-of-use. TriboLab can perform practically every common tribological test on nano and micro scales. Due to its range of testing abilities and multiple possible configurations, it is used extensively across a wide variety of industries, including biomedical, microelectronics, paper, and coatings, and throughout common industrial processes in petroleum, aerospace, automobile, engine, bearing, and fastener manufacturing.

    Industry-Specific Solutions for Specialized Performance
    Bruker has utilized the versatility and modular architecture of the TriboLab platform to create turn-key kits for specific applications and industries. In addition to tailored hardware components, these modules feature software developed in conjunction with industry-leading manufacturers to address targeted standards. Bruker’s industry-specific solutions include Brake Material Screening, Clutch Friction Material Screening, 3-Point-Bend Testing, and Hot-Hardness Testing.

    Modular Drives for Maximum Versatility
    Quick changeover of drives using tool-less clamping allows the user to position the drive easily, then lock it into place in seconds. No cable connections are required for standard drives, and blind-mate connectors on the mounting ring automatically connect fans, sensors, and other electronics. Each hardware component includes a Tribo ID chip. Software interrogates the system, interprets the chip and “understands” the configuration without operator-entered commands.

    High-Load, High-Performance Sensors
    The UMT TriboLab excels at producing highly accurate and repeatable test data by utilizing the latest developments in sensor technology from Bruker. These new “Gold Series” sensors offer noise levels at an industry-leading 0.02% of full scale values, with circuitry completely redesigned to reduce noise to an absolute minimum. The range of sensors also has been extended to eleven sensors, spanning forces from 1 milliNewton up to 2 kiloNewtons.

    Complete, Uncompromised Mechanical Testing
    Researchers and industry specialists involved in the study of friction, wear, corrosion and lubricants have produced well-documented studies on the detrimental and costly impact surface degradation has on machinery, manufactured products , and manufacturing efficiency. Tribology crosses all industries, from mechanical, electromechanical, to chemical and even biological systems. Design requirements in these areas often depend heavily on very accurate friction and wear values for proper functioning of parts and assemblies, and to minimize waste.

    Controlling friction and wear is a complex science. High friction and high wear do not always equate; friction force is not proportional to load force; friction coefficients of materials are not absolute, but instead represent values obtained under specific use conditions; and environmental conditions, such as heat and moisture, can impact not only how a testing procedure is done, but the test results, as well. It’s complicated.

    Bruker’s TriboLab system is designed for tribology testing in real-world conditions. And as the most versatile, easiest to use, and most accurate tribology testing system available, it is capable of high performance testing across many industries.

    • Brake Material Screening
    • Lubricants Testing
    • Testing of Thin Films and Coatings
    • Glass Strength and Scratch Resistance
    • Oil and Gas Refinery Applications
    • Measuring Very Low Friction Forces
    • High-Temperature Materials Testing
    • Stress-Strain-Bend Testing
    • Hardmetals and Hardfacings Testing

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/tribometers-and-mechanical-testers/umt-tribolab/overview.html

  • (2) AFM / FAST SCAN
    Dimension Fastscan

    The Dimension FastScan® delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Delivering High Performance on Any AFM Sample
    • Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift
    • Sample from subnanometer to hundreds of nanometers in height without loss of resolution

    Whether using the Icon scanner with ultra-low noise and high accuracy, or employing the FastScan scanner for high scan rates, the Dimension FastScan system will expand your laboratory’s capabilities beyond that of any other single instrument you can purchase.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-fastscan/overview.html

  • (2) STYLUS PROFILER / LARGE SAMPLE
    Dektak XTL

    Large-Format Wafer and Panel Measurement
    The Dektak XTL™ stylus profiler provides extremely accurate, repeatable, and reproducible metrology for a wide range of applications. With its ability to accommodate samples up to 350mm x 350mm, this system finally brings legendary Dektak performance to 200mm and 300mm wafer manufacturing.

    The Dektak XTL features a small footprint and integrated isolation with interlocking doors, making it ideal for today's demanding production floor environments. Its dual-camera architecture enables enhanced spatial awareness, and its high level of automation enhances manufacturing throughput. Bruker's exclusive Vision64 advanced production interface with optional pattern recognition makes data collection an intuitive and repeatable process, and minimizes operator-to-operator variability.

    New software features make the Dektak XTL the most powerful, easiest to use stylus profiler available. The system utilizes Vision64 software that is fully compatible with Bruker’s optical profiler line. The Vision64 software enables unlimited measurement sites, 3D mapping, and highly customized characterization with hundreds of built-in analysis tools.

    Also use Vision Microform software to measure shapes such as radius of curvature. Use pattern recognition to minimize operator error and enhance measurement location accuracy. Data collection and 2D and 3D analysis are in one software package with an intuitive flow. Each system comes with a Vision software license which can be installed on a separate PC with Windows 7 OS so data analysis and reports can be created at your desk.

    With its unique combination of superior performance and ease of use the Dektak XTL is the new standard for industrial thin film deposition monitoring in touch-panel, solar, flat panel display and semiconductor industries for research and QA/QC.

    Analyzes large samples
    • Encoded 300mm X/Y stage
    • Accommodates 200 & 300mm wafers
    • Up to 350mm x 350mm panels

    Industrial design
    • Integrated isolation platform
    • Incorporated keyboard/monitor
    • Small footprint workstation

    Optimized features for QA/QC
    • Pattern recognition
    • Advanced production interface
    • Interlocked doors
    • Localized GUI
    • Auto-ready kit for SECS/GEM

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/stylus-profilometers/dektak-xtl/overview.html

  • (3) TRIBOLOGY / MECHANICAL TESTING / CMP
    TriboLab CMP

    Small R&D-Scale Specialty System for CMP

    Polishing Process Control for Process Development and Materials Testing
    The new TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes.
    • Reproduces full-scale wafer polishing process conditions without downtime on production equipment
    • Provides unmatched measurement repeatability and detail
    • Allows testing on small coupons for substantial cost savings over whole-wafer testing

    The Standard for Mechanical Test Labs
    Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab™ platform. TriboLab CMP is the only process development tool on the market that can provide a broad range of polishing pressures (0.05 - 50 psi), speeds (1 to 500 rpm), friction, acoustic emissions, and surface temperature measurements for accurate characterization of CMP processes and consumables.

    On-board Diagnostics for Better Understanding of Polishing Processes
    • Delivers more visibility into transient polishing properties than any other system on the market
    • Collects data from the instant the substrate touches the pad and throughout the entire test
    • Enables early-stage process development decisions through more complete, detailed data

    Flexibility in Sample Type, Size, and Mounting Configurations
    • Polishes any flat material, using virtually any conditioning disc, any slurry, and any pad
    • Accomodates small coupons through whole 100mm wafers with ease
    • Accepts multiple sample mounts for flexibility


    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/tribometers-and-mechanical-testers/tribolab-cmp-process-and-material-characterization-system/overview.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension XR

    Dimension XR – Enabling First-and-Only AFM Capabilities and Performance
    Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation to deliver the utmost performance, functionality, and capability in nanoscale investigation. The extreme research (XR) family of SPMs for FastScan® and Icon® AFM platforms provides unique packaged solutions for advanced research in nanomechanical, nanoelectrical, and nanoelectrochemical characterization. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier.

    • Quantitative Analysis for Nanomechanical Applications
    • Multi-Dimensional Nanoelectrical Characterization
    • Highest Resolution Scanning Electrochemical Imaging
    • Unlimited Flexibility to Expand Your Research

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-xr/overview.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension Icon

    Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This level of performance has established the new generation of what Atomic Force Microscopy should be.

    Ultimate Performance
    • Proprietary sensor design achieves closed-loop performance with noise levels for previously unseen on any AFM
    • Significantly reduced noise floor at less than 30pm enabling imaging at sub-nanometer resolution
    • Drift rates less than 200pm per minute render distortion-free images immediately

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Exceptional Productivity
    • Integrated alignment tools deliver quick and optimized probe positioning
    • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
    • ScanAsyst® Imaging and NanoScope® software with default experiment modes distill decades of knowledge into preconfigured settings

    Superior Versatility
    • Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
    • Most sensitive and complete nanoscale mapping of permittivity and conductivity with PeakForce sMIM™
    • Instrument and software designed to take full advantage of all current and future Bruker AFM modes and techniques
    • Custom user-programmable scripts offer semi-automated measurement and analysis

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon/overview.html

  • AFM / ENTRY LEVEL
    Innova

    The Best-Value Research AFM

    Providing complete AFM capabilities to fit your budget
    The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.

    Optimized for Performance
    All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultra-low noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultra-low noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

    High-Resolution System
    • Utilizes an innovative design optimized for lowest closed-loop noise and drift
    • Ensures accurate measurements at all scales and in all dimensions
    • Delivers highest resolution results with great ease

    Fast Setup for Every Experiment
    • Provide fastest hardware setup via ergonomic open stage and premounted cantilever option
    • Ensures fast and precise region of interest identification with software-controlled high-NA optics
    • Distills decades of AFM expertise into preconfigured software settings
    • Enables seamless operation from survey to atomic resolution

    Powerful Research Flexibility
    • Addresses all advanced measurements with full range of SPM modes
    • Customizes research with configurable signal access and physical access to tip-sample junction
    • Offers nano-optics with TERS-enabled AFM-Raman integration

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/innova/overview.html

  • AFM / IR
    Anasys NanoIR3

    Nanoscale Infrared Spectroscopy | nanoIR

    Bruker Anasys Instruments is the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales. We are dedicated to delivering innovative products and solutions that measure spatially varying physical and chemical properties with nanoscale spatial resolution in a diverse range of fields, including polymers, 2D materials, materials science, life science and micro-electronics industry.

    Anasys nanoIR products have been adopted by leading scientists at major research universities, national laboratories and leading chemical/materials companies worldwide. With an impressive and growing publication record, our customers have proven the ease of use and productivity in real-world applications.

    nanoIR3
    The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications.

    • True model free nanoscale IR absorption spectroscopy
    • 10nm resolution chemical imaging with Tapping AFM-IR
    • FAST spectra AFM-IR provides high resolution, nanoIR spectroscopy in seconds
    • Rich, interpretable IR spectra that directly correlates to FTIR
    • Correlative microscopy with nanoscale property mapping and full featured AFM
    • "Anasys engineered" for ease of use, productivity and reliability

    nanoIR3-s
    The nanoIR3-s draws on a legacy of award winning products and represents the state of the art for nanoscale spectroscopy, imaging and materials analysis.

    • Two complementary nanoscale IR techniques – s-SNOM and AFM-IR
    • 10nm resolution chemical and optical property mapping
    • nano FTIR high performance broadband spectroscopy
    • Correlative microscopy with nanoscale property mapping and full featured AFM
    • "Anasys engineered" for ease of use, productivity and reliability

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/nanoscale-infrared-spectrometers.html

  • AFM / LARGE SAMPLE
    Dimension Edge

    The Best Value High-Performance AFM

    Best-in-class AFM capabilities to match all research budget levels
    Dimension Edge™ leverages the many innovations of the Dimension Icon® System to provide levels of performance and functionality only available from Bruker. At the heart of this system’s capabilities is Bruker’s revolutionary closed-loop tip scanner, which reduces closed-loop positioning noise levels to the length scale of a single chemical bond.

    Highest Productivity for Any User
    • Proprietary ScanAsyst imaging enables instant expert results
    • High-resolution, 5MP camera and integrated stage control provide fast sample navigation and efficient multi-site measurments
    • Linear workflow and seamless transition from survey to highest resolution delivers accurate results in a short time

    Best Value Closed-Loop Dimension AFM
    • Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
    • Significantly reduced noise and drift values bring small-sample imaging performance to a large-sample AFM
    • Modular microscope and electronics design enable high image fidelity at moderate cost

    Solutions for All Applications on Any Sample
    • Open stage access accommodates wide variety of experiments and samples
    • New instrument design and software take full advantage of Bruker's full suite of AFM modes, including advanced electrical and electrochemical applications
    • Built-in access to signal routing enables custom measurements to take research in new directions

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-edge/overview.html

  • AFM / LIFE SCIENCE
    JPK NanoWizard® AFM

    Specialized solutions for applications ranging from BioAFM and Polymer Research to Surface Science and NanoOptics

    The NanoWizard® is the most flexible high-end AFM on the market. It sets the benchmark in resolution, speed and stability in particular for fluid applications. All NanoWizard® systems provide true integration of AFM with optical microscopy by means of our patented DirectOverlay™ feature for precise and easy work, and comes with a large variety of options and accessories. In addition, the NanoWizard® family comes with the QI™ Mode, an easy and intuitive imaging mode for quantitative imaging.

    NanoWizard® 4 BioScience AFM
    For applications in Life Science and Soft Matter research on single molecules, living cells and tissues. The system combines highest usability with high-quality measurements. Cutting-edge technology from the pioneers of BioAFM.

    NanoWizard® 4 NanoScience AFM
    For applications in materials and polymer science ranging from nanomechanics and electrochemistry to electrical and magnetic measurements.

    BioMAT™ Workstation
    For opaque samples, combining upright optical microscopy with AFM for surface science and life science.

    NanoWizard® Sense AFM
    The best start in AFM for applications in materials and life science.

    NanoWizard® ULTRA Speed 2 AFM
    High-speed imaging and super-resolution AFM on inverted microscopes, paired with unparalleled flexibility.

    NanoWizard® NanoOptics AFM
    Comprehensive solution for advanced experiments which combine AFM and optical spectroscopy such as TERS, Aperture SNOM and sSNOM, confocal microscopy and nano manipulation in optical fields.

    OT-AFM Combi-System
    NanoTracker™ & NanoWizard® - Powerful combination of Optical Tweezers & AFM in one system for force measurements in 2D and 3D from 500fN to 10nN.

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy

  • AFM / LIFE SCIENCE / INVERTED MICROSCOPE
    NanoWizard® ULTRA Speed 2 AFM

    A new benchmark: True atomic resolution and high-speed imaging with 10 frames/sec

    The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes the system highly flexible and upgradable.

    The NanoWizard ULTRA Speed 2 provides a range of new features:
    • NestedScanner Technology for high-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    • PeakForce Tapping® for easy imaging
    • New tiling functionality for automated mapping of large sample areas
    • V7 Software with revolutionary new workflow-based user interface
    • DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms
    • Vortis™ 2 controller for high-speed signal processing and lowest noise levels

    High-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    The system comes with the lowest noise and highest stability available on the market to provide true atomic resolution. Direct force control at ultra-low forces prevents damage to your samples and probes. With the state-of-the-art position sensor technology, the system delivers highest accuracy and maximum precision.

    Until now, performing dynamic experiments on living cells, highly corrugated samples or steep surface structures with highest spatial and temporal resolution was challenging. With our new NestedScanner technology, cells, bacteria or structured surfaces with samples heights up to 8µm can now be examined at the highest scan speeds.

    • Observe sample dynamics in real-time with highest resolution
    • Access to corrugated and higher surfaces with the NestedScanner technology
    • Combine AFM and optical fluorescence microscopy for multiparametric in-situ experiments
    • Enhance productivity, probe more sample positions faster

    Key features
    • High-speed imaging with 10 frames/sec with excellent resolution
    • Now with Bruker’s exclusive PeakForce Tapping as standard
    • Revolutionary new workflow-based user interface for ergonomics and ease of operation
    • New tiling functionality for automated mapping of large sample areas together with the HybridStage
    • Unique integration with optical microscopy by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy
    • New Vortis 2 controller with high-speed low-noise DACs and cutting-edge position sensor readout technology
    • Highest flexibility and upgradeability with a broad range of modes and accessories

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy/nanowizard-ultra-speed-2

  • AFM / MATERIALS / FLEXIBLE MODES
    MultiMode 8-HR

    Designed for Performance
    The legendary performance and reliability of the MultiMode platform is the result of both its superior mechanical design and the industry’s lowest noise control electronics. The secret to its continued presence at the leading edge of AFM research is its ability to incorporate all the latest technology advances.

    Faster and More Productive
    • The NEW high-speed ScanAsyst-HR is now available, enabling fast scanning on the MultiMode 8-HR AFM system
    • 20X faster survey scan rates and up to 6X faster scans with no loss of resolution

    Versatility to Satisfy More Applications
    • TThe MultiMode 8-HR AFM is equally well suited for imaging in both air and fluid
    • Heating to 250°C, cooling to -35°C with temperature control accessories
    • A large variety of standard operating modes and many unique capabilities enable the MultiMode 8-HR AFM system to characterize everything from mechanical to electrical properties

    Easier Expert-Quality Results
    • Bruker's proprietary ScanAsyst atomic force microscopy scan technology mode offers automatic image optimization, continuously adjust scan rate, setpoint and gains to obtain the highest quality image and to deliver faster, more consistent results
    • Imaging in fluid has never been easier with no need for cantilever tuning and with ScanAsyst continuously monitoring the tip-sample interaction force, thereby eliminating setpoint drift

    Exclusive & Powerful Quantitative Imaging Modes
    • PeakForce QNM enables direct mapping of nanomechanical properties, including elastic modulus, adhesion and dissipation, at high resolution and normal scan rates
    • PeakForce TUNA™ enables quantitative conductivity mapping on delicate samples that can't be imaged with conventional conductive AFM

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/multimode-8-hr/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Dimension Icon-Raman

    Highest Performance AFM with Co-Localized Micro-Raman Capability

    Incorporating the industry-leading AFM and a research-grade confocal Raman microscope on a single platform.
    With the introduction of integrated Raman spectroscopy capability, Bruker's Dimension Icon® platform again sets a new standard in high-performance surface characterization, enabling colocalized measurements with unsurpassed efficiency and ease.

    The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample.

    When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

    The Dimension Icon AFM-Raman system, consisting of the Icon AFM and a research-grade confocal Raman microscope (Horiba, LabRam, etc.), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument’s full functionality, providing optimum combined performance.

    Key Features
    • Fully integrated system delivers convenient correlation of advanced AFM data with information on chemical composition or crystallographic structure
    • High-resolution X-Y stage permits fast and accurate positioning between the AFM and Raman microscope
    • Full range of AFM capabilities provides more features than any other system
    • PeakForce QNM® enables quantitative nanoscale mechanical property mapping
    • „„Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
    • „„ScanAsyst® enables dramatically more productive imaging with fully automatic parameter optimization, guaranteeing best results on the most delicate samples

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon-raman/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Innova-IRIS

    The Most Complete TERS Solution

    Enabling highest performance AFM-Raman research
    Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.
    • Delivering high-performance TERS with complete SPM capabilities
    • Offering performance exclusively enabled by Bruker's commercially available TERS probes
    • Providing productive measurement with guaranteed TERS performance

    Innova - The Best Place to Start Your AFM Research
    This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

    Providing Complete AFM Capabilities
    All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid. With closed-loop noise levels approaching those of open-loop operation, superior image quality is achieved from the full 90-micron scan range down to submicron images on any sample, whether it is a semiconductor, a soft and nanostructured material, or DNA.
    In addition, closed-loop scan linearization can be activated and deactivated on the fly.This incredible flexibility allows zooming down to atomic resolution on any selected portion of a full size scan, without changing scanner hardware and without withdrawing the probe from the surface.

    Fast Setup for Every Experiment
    The patented top-down optics of the Innova integrate seamlessly with all imaging modes. With softwarecontrolled optical zoom, they provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.
    Innova has also been specifically designed to provide quick and easy tip exchange and alignment. The Innova head rests kinematically on three independently controlled motors that allow height, pitch, and tilt adjustments relative to the sample, and user-defined positions can move the head in sub-micron increments. In addition, the system comes complete with a universal chip carrier that accepts almost any unmounted cantilever.

    Easiest to Use AFM for Spectroscopy in Nanostructured Materials
    • Ergonomic hardware and streamlined software with integrated setup diagnostics deliver instant research quality results
    • Experiment Selector” distills decades of knowledge into preconfigured settings, mitigating the complexity of traditional TERS setups

    Highest Performance, Most Complete AFM Capabilities
    • Fully featured suite of advanced topographic, electrical, mechanical, and thermal AFM capabilities enables correlated property mapping
    • System design for noise and drift elimination enables high-resolution imaging and long Raman integration times

    True Nanoscale Spectroscopy Targeted to Your Application
    • Modular accessories tailor system to targeted applications
    • Optimized optical access enables capture of weak Raman signals for nanoscale chemical mapping, even on challenging samples

    The Most Complete TERS Solution
    • Innova-IRIS is compatible with Bruker's new high-contrast IRIS TERS probes, providing a complete TERS solution with highest sensitivity and spatial resolution

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/innova-iris/overview.html

  • AOI, Automatic Optical Inspection
    BX AOI

    "Nordson YESTECH's advanced 5 megapixel color camera imaging technology offers benchtop PCB inspection with exceptional defect coverage. This benchtop system inspects solder joints and verifies correct part assembly enabling users to improve quality and increase throughput. The optional four side viewing cameras add additional inspection capabilities found only on in-line systems.

    Programming the BX is fast and intuitive. Operators typically take less than 30 minutes to create a complete inspection program including solder inspection. The BX utilizes a standard package library to simplify training and ensure program portability across manufacturing lines. Programs created with the BX are also compatible with Nordson YESTECH's complete line of AOI systems.

    Advanced Fusion Lighting™ and newly available 5 megapixel image processing technology integrates several techniques, including color inspection, normalized correlation and rule-based algorithms, to provide complete inspection coverage with an extremely low false failure rate.

    The BX is equally effective for paste, pre / post-reflow and even final assembly inspection. Remote programming maximizes machine utilization and real-time SPC monitoring provides a valuable yield enhancement solution."

  • AOI, Automatic Optical Inspection
    FX940 AOI

    "Nordson YESTECH’s advanced 3D imaging technology offers high-speed PCB inspection with exceptional defect coverage. With one top down viewing camera, four side viewing cameras and 2D + 3D inspection, the FX-940 ULTRA inspects solder joints and verifies correct part assembly enabling users to improve quality and increase throughput.

    Programming the FX-940 ULTRA is fast and intuitive. Operators typically take less than 30 minutes to create a complete inspection program including solder and lead inspections. The FX-940 ULTRA utilizes a standard package library to simplify training and ensure program portability across manufacturing lines.

    Advanced LED lighting and newly available image processing technology integrates several techniques, including 3D inspection, color inspection, normalized correlation and rule-based
    algorithms, to provide complete inspection coverage with an unmatched low false failure rate.

    Configurable for all line positions, the FX-940 ULTRA is equally effective for paste, pre / post-reflow and final assembly inspection. Off-line programming maximizes machine utilization and real-time SPC monitoring provides a valuable yield enhancement solution.
    "

  • AOI, Automatic Optical Inspection
    M1 Series AOI

    "Nordson YESTECH's advanced megapixel technology offers high-speed PCB inspection with exceptional defect coverage. With high resolution and telecentric optics, M1 Series inspects solder joints and verifies correct part assembly, all within a footprint less than 1 meter wide, enabling users to improve quality and increase throughput.

    Programming the M1 Series is fast and intuitive. Operators typically take less than 30 minutes to create a complete inspection program including solder inspection. The M1 Series utilizes a standard package library to simplify training and insure program portability across manufacturing lines.

    Newly available image processing technology integrates several techniques, including color, normalized correlation and rule-based algorithms, to provide complete inspection coverage with an extremely low false failure rate.

    Configurable for all line positions, the M1 Series is equally effective for paste, pre / post-reflow or final assembly inspection. Off-line programming maximizes machine utilization and real-time SPC monitoring provides a valuable yield enhancement solution."

  • AOI, Automatic Optical Inspection
    M2 AOI

    "Nordson YESTECH’s advanced megapixel technology offers high-speed device inspection with exceptional defect coverage. With high resolution and telecentric optics, M2 inspects bond wires,die placement,SMT components and substrates,all within a footprint less than 1 sq. meter.The M2 can be put in-line with your wire bonders or off-line to support several bonders.
    A magazine loader/unloader is available for off-line operations.

    Programming the M2 is fast and intuitive.With CAD data input, a complete recipe can be completed in less than 1 hour*. The offline programming option allows the engineer to create complete recipes at any remote location, without affecting production.

    The M2 utilizes several image processing algorithms to perform a multitude of inspections historically performed manually by operators using eyepiece microscopes.Real-time color,normalized gray scale correlation,pattern matching and binary “blob”analysis are just a few of the tools used to automate the process.


    Nordson YESTECH’s M2 also provides you with SPC data, defect reports, offline defect classification,offline rework capability and even archived images of every device you inspect. In addition, Nordson YESTECH also provides free software upgrades for the life of the system."

  • AUGER ELECTRON SPECTROSCOPY (AES) / SURFACE ANALYSIS / SPECTRAL ANALYSIS
    PHI 710

    Auger Electron Spectroscopy (AES, Auger) is an analytical technique that provides compositional and distributional information of elements on the top few monolayers of a material by irradiating an electron beam to the surface of a solid material and measuring the energy of Auger electron emitted from the sample surface. The PHI 710 Scanning Auger Nanoprobe is a high performance surface analysis system that provides nanometer level Auger analysis. The acoustic enclosure and the built-in vibration isolators allow compositional and distributional measurement by 500,000 magnification that conventional Auger system never achieved.

  • AXI, Automatic X-ray Inspection
    XT-Series Universal Offline AXI

    "The XT-series provides the advanced inspection capability of Nordson MATRIX‘s inline system in a smaller footprint manual load/island of automation system. The platforms are designed for flexibility and ease of use for a wide variety of products requiring 2D and 2.5D automated X-ray inspection. The XT-6/XT-6A platform is a highly flexible automated X-ray inspection system with minimum footprint and a parallel-kinematic Hexaglide manipulation unit for extreme-angle off-axis image acquisition with high resolution. It is suitable for high-quality X-ray analysis of electronic assemblies and material analysis of parts that require flexible part manipulation with multiple inspection angles. For batch modes and volume inspection the XT-6 can be equipped with a single-sided conveyor setup and magazine load/unload station (XT-6A).
    Flexible AXI system for manual load and island of automation configurations
    Microfocus X-ray tube (sealed tube / maintenance free)
    Extreme angle shot capability (up to 65 deg)
    Multiple programmable motion system with servo drives
    Digital CMOS flatpanel detector
    Automatic grey-level and geometrical calibration
    Barcode scanner for serial number and product type selection
    Full product traceability via customized MES-Interface"

  • AXI, Automatic X-ray Inspection
    X-Series AXI

    "The X-platform series is a dedicated high speed inline automated X-ray inspection system for the inspection of PCB-assembly boards for single/multipanels or samples in trays. The system offers market leading inspection speed and is ideal for low-mix high-volume production environment.
    High Speed AXI System for Inline configurations
    Microfocus X-ray tube (sealed tube / maintenance free)
    Multiple programmable motion system with linear drives
    Digital CMOS flatpanel detector
    Automatic grey-level and geometrical calibration
    Barcode scanner for serial number and product type selection
    Full product traceability via customized MES-Interface"

  • AXI, Automatic X-ray Inspection
    XCT-Series AXI Platform With CT Technology

    The XCT-series systems are manually loaded, automated X-ray CT systems which offer a solution for a variety of CT applications. These systems provide the highest possible flexibility in order to satisfy individual customer needs. Depending on the application, they can be equipped with different types of tubes and detectors to offer high-resolution or high-power solutions. Unlike most CT systems, the XCT-1000 features both volume analyzing and automatic processing of the slices. As the newest feature, this machine is available with a super high resolution setup, offering a CT voxel size less than 1µm. It is especially suitable for the inspection of small to medium production volumes or for the use in laboratory environments, production sampling or failure analysis. The applications range from consumer electronics and automotive li-ion batteries, component level inspection for wire bonds, micro-solder-joints on PCB‘s, casting parts and semiconductors.

  • AXI, Automatic X-ray Inspection
    XS-Series AXI

    "The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
    High speed AXI system with minimum footprint for inline setups
    Microfocus / Submicron X-ray tube (sealed tube / maintenance free)
    Resolution down to <1µm
    Multiple programmable motion system with servo drives
    Digital CMOS flatpanel detector
    Automatic grey-level and geometrical calibration
    Full product traceability via customized MES-Interface"

  • CONFOCAL SOUND ACOUSTIC MICROSCOPE / ELECTRONICS
    C-SAM (AW Series)

    The AW™ Series are advanced high-capacity, high throughput, automated C-SAM® instruments specialized for maximum sensitivity for evaluation of wafer bond applications. The AW Series delivers a better than 5 micron sensitivity, throughputs that are approximately two times faster than competitive systems and non-immersion scanners that eliminate false positives due to DI water ingression. The AW Series automatically handles, inspects and sorts boned wafers based on user-defined accept/reject criteria and are designed to handle wafers bonded by virtually any method, including direct fusion, anodic, glass frit and epoxy bonding.

  • CONFOCAL SOUND ACOUSTIC MICROSCOPE / ELECTRONICS / QUALITY CONTROL
    C-SAM (GEN 6)

    The Gen6™ C-Mode Scanning Acoustic Microscope is the newest generation in Acoustic Microscopy Imaging (AMI) innovation. While taking the best from the Gen5™ (e.g. advanced features, aesthetics, and ergonomics), the Gen6 improves upon the rest and takes acoustic imaging to the next level.

    The Gen6 delivers the broadest range of capabilities available. Whether your needs are for nondestructive failure analysis, process development, R&D, High-Rel qualification for a military application, or low/medium-volume screening, the Gen6 is the one C-SAM system that can meet all of your demands. Gen6 is perfect for a variety of applications, such as; Microelectronics, MEMS, SSL LEDs, Power Modules, Solar, High-Tech materials, etc.

    As the ultimate laboratory analysis tool, the Gen6 includes SonoSimulator as a standard feature to simplify the analysis of devices with multiple thin layers.

    Advanced Sonoscan capabilities such as PolyGate™, Virtual Rescanning Mode (VRM™), and available Frequency Domain Imaging (FDI™) add value and confidence. With its large, easy-access, illuminated scanning area, the Gen6 has the capability to efficiently scan everything from a single part, to a 300mm wafer, with its tower referenced scan and fixtures.

    In addition to being packed with leading Sonoscan innovations, the Gen6 was carefully designed with the user in mind. Its ergonomic features make it comfortable and convenient to use. Its advanced applications Sonolytics™ software and new intuitive operator interface menus help maximize results, while saving operator time. Plus, its open access and illuminated tower referenced sample stage allow for easier loading and unloading of samples. The Gen6 is truly the new generation C-SAM, delivering a package of technology, ergonomics, and advanced Sonoscan-developed features that cannot be found anywhere else.

  • CONTACT ANGLE / SURFACE CLEALINESS / WAFER
    VCA Optima Video Contact Angle Tester

    The VCA Optima series incorporates lightweight design, easy assembly, and the latest Windows™ standards and user-friendly software to create a contact angle instrument that is accurate and easy to use. VCA-optima systems are suitable for research or quality control in R&D and process engineering. Systems range from the basic Optima to the fully equipped Optima XE. Features include Dynamic capture capability, Motorized syringe, Surface energy analysis and Pendant drop analysis, to name a few.
    The VCA Optima utilizes a precision camera and advanced PC technology to capture static or dynamic images of the droplet and determine tangent lines for the basis of contact angle measurement. A manual or automatic syringe provides easy dispensing of test liquid. Computerized operation eliminates human error in line drawing and captures dynamic images for time sensitive analysis. Data and images are stored in the computer for later analysis or easy transfer to other software applications.

  • CONTACT ANGLE / SURFACE CLEALINESS / WAFER
    VCA 3000S Video Contact Angle Tester

    VCA-3000S Wafer Surface Analysis Systems are specially designed for use in semiconductor wafer processing quality control. The system provides quick and accurate contact angle/surface energy analysis on wafer surface to evaluate adhesion, cleanliness and coatings.

    The syringe mechanism can be raised for easy loading and unloading eliminating the possibility of wafer damage.

    Although the system was designed for wafer surface analysis it is also a useful tool for any application that requires a large stage. Samples sizes up to W12” x L12” x H.75” can easily be accommodated by this system

    The VCA 3000s utilizes a precision camera and advanced PC technology to capture static or dynamic images of the droplet and determine tangent lines for the basis of contact angle measurement. Manual or automatic syringe provides easy dispensing of test liquid. Computerized operation eliminates human error in line drawing and captures dynamic images for time sensitive analysis. Data and images are stored in the computer for later analysis or easy transfer to other software applications.

  • DECAPSULATION SYSTEM
    Decapsulation System

    The Laser IC Opener has released PL101i and PL121i. These models are able to decap Cu wire IC and also perform decapsulation on ultra small packages in constant pursue for improvement in usability. It is possible to upgrade from the current standard type to the new "i" type.

  • DESKTOP SEM / ENTRY LEVEL
    Phenom Pure

    The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs.

    The Phenom Pure provides high-quality images using basic features, and offers the market’s fastest loading and imaging time. The reliable autofocus and source alignment make this the most user-friendly system on the market. The Phenom Pure is the most economic and efficient tool for high-resolution imaging.
    Its worry-free maintenance is unique in its product category and maximizes system uptime. With these characteristics, the Phenom Pure can be operated by any staff member, bringing high-magnification imaging within the reach of all lab personnel.

  • DESKTOP SEM / HIGH RESOLUTION
    Phenom Pro

    The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention.
    The backscattered-electron detector (BSED) and detection chain are optimized to work together and give results with unmatched signal-to-noise images on a large variety of samples.
    The Phenom Pro can be upgraded with a Pro Suite system. The Pro Suite system offers a variety of software applications that will automate data collection and image interpretation. Some examples are Fibermetric - automated measurements and classification of fiber and filter samples, 3D Roughness Reconstruction, and Automated Image Mapping - an automated way of collecting high-resolution overview images.
    A large variety of sample holders is available for facilitating the fast loading of any sample into the Phenom. From long axial-shaped samples to moist biomaterials, there is always a suitable container for the sample that needs to be analyzed.
    The Phenom Pro is a complete and ready-to-go system. The imaging unit, touch-screen monitor, rotary knob, power supply, pre-vacuum pump and standard sample holder are included. Unpack, install and it’s ready for action without the need for a PC, laptop or other peripherals.

  • DESKTOP SEM / HIGH RESOLUTION / EDX
    Phenom ProX

    The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system.
    With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic structures only solves half the problem when analyzing samples. It is often necessary to collect more than optical data to be able to identify the different elements in a specimen. This is accomplished in the Phenom proX with a fully integrated and specifically designed EDS detector.
    EDS is a technique that analyzes X-rays generated by the bombardment of the sample by an electron beam. EDS elemental analysis is fully embedded into the Phenom ProX system. X-ray detector and control software are combined in one package. This Elemental Identification (EID) software package allows the user to program multiple point analysis, and identify any hidden elements within the sample. Additionally, this software can be expanded with elemental mapping functionality. The step-by-step guided process within the EID software helps the user to collect all X-ray results in an organized and structured way.

  • DESKTOP SEM / LARGE SAMPLE STAGE
    Phenom XL

    The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities. Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click – within seconds.

  • DRY ETCHING SYSTEM
    Dry Etching System

    ES373 is Dry Etching System designed for Advanced LSI with Fine Process. It has superior functions and Ease of Use as system is specialized for LSI Failure Analysisthat has the capability for high aspect ratio etching on multi-layered devices. Memory function to store variable etching conditions.

  • DUAL BEAM / SEM / FIB
    Versa 3D Dual Beam

    Building on the history and success of FEI's pioneering DualBeam, low vacuum and ESEM™ expertise, FEI introduces the most versatile DualBeam instrument to date. The Versa 3D offers state-of-the-art imaging and analytical performance to deliver a greater range of 3D data from even your most challenging samples.

    Versa 3D's highly configurable platform allows customers to adapt the system's capabilities to their specific requirements. The combination of high and low vacuum modes gives the flexibility to work with a range of samples including uncoated and non-conductive samples. Optional ESEM mode allows electron beam imaging of naturally hydrated samples and supports in situ analysis and experimentation with additional dynamic temperature stages.

  • DUAL BEAM / SEM / FIB / EXTREME HIGH RESOLUTION (XHR)
    Helios Nanolab

    The Helios NanoLab™ DualBeam™ has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.

    With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements.

  • DUAL BEAM / SEM / FIB / ULTRA HIGH RESOLUTION (UHR)
    Scios Dual Beam

    FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

    Advanced detection technology is at the very core of the FEI Scios. In-lens FEI Trinity™ detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data. An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

  • FIB (PLASMA) / MILLING / ELECTRONICS
    Vion Plasma FIB

    The FEI Vion™ Plasma Focused Ion Beam System (PFIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. By incorporating plasma ion source technology, the Vion PFIB delivers increased throughput over conventional gallium FIB instruments-with speeds more than 20x faster for site-specific cross-sectioning and large area milling, as well as sample preparation. With both excellent milling precision and high-resolution imaging at low beam currents, the Vion PFIB delivers the speed, accuracy and high contrast images essential for a wide range of process control, failure analysis or materials research applications.

  • Handheld XRF
    Vanta

    The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field.

    Vanta handheld XRF analyzers are built to be tough. Their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership.

    With intuitive navigation and configurable software, the Vanta series are easy to use with minimal training for high throughput and a fast return on investment. Featuring innovative and proprietary Axon technology, Vanta analyzers give you accurate results and help boost productivity no matter the environment or working conditions.

    Exceptional durability under extreme conditions.
    Analytical superiority.
    Optional Wireless LAN and Bluetooth® for real-time data sharing. Cloud technology enabled.
    Intuitive user interface.

  • Handheld XRF
    Delta Element

    The DELTA Element is the most affordable unit in the Olympus line-up of handheld X-ray fluorescence (XRF) analyzers designed for fast, accurate results. Fast, simple and reliable, the DELTA Element incorporates the features and rugged design of the DELTA family. With fast elemental ID for screening, sorting and metal analysis, the DELTA Element provides fast ROI for Scrap, PMI, QA / QC and Jewelry / Precious Metals applications.

    With a powerful X-ray tube and Si-PIN detector, the DELTA Element is ideal for simple applications. It provides quick ID, screening, sorting and elemental and metal analysis.

    The DELTA Element offers fast measurement with results in seconds, low limits of detection, and outstanding precision.

    The DELTA Element's field-worthy and rugged design features rubber overmolds and an ergonomic grip to protect the analyzer. To avoid downtime, the hot swap feature allows the batteries to be swapped out while the analyzer is in use. The DELTA Element features wide area heat sinks for high power use in extreme temperatures.

    Olympus' exclusive Grade Match Messaging (GMM) feature provides information to simplify verification and streamline operations. Users can assign customized messages to any grade and use real-time or pop-up messages for immediate sorting instructions and improved user efficiency.