• (1) AFM / SCANNING MODE / HIGH RESOLUTION
    PeakForce Tapping®

    PeakForce Tapping - How AFM Should Be
    Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high-resolution imaging, extends AFM measurements into a range of samples not previously accessed, and uniquely enables simultaneous nanoscale property mapping.

    Highest resolution imaging
    PeakForce Tapping enables the researcher to precisely control probe-to-sample interaction, providing the lowest available imaging forces. This superior force control results in the most consistent, highest resolution AFM imaging for the widest range of sample types, from the softest biological samples to very hard materials. PeakForce Tapping routinely resolves subunits in individual molecules, the kind of resolution that used to be thought of as only possible with scanning tunneling microscopy (STM).

    Unique, quantitative results, whatever you measure
    PeakForce Tapping’s piconewton (pN) force sensitivity simultaneously and uniquely combines the highest resolution AFM imaging with quantitative, nanoscale electrical, mechanical, biological, and chemical property mapping, enabling researchers of all experience levels to make new discoveries.

    Easy to use, making every user an AFM expert
    PeakForce Tapping’s linear force control provides the user with unmatched AFM ease of use with the intelligent ScanAsyst® image optimization software, and the low forces preserve the probe shape for longer life and more consistent imaging.

    Featured on the following Bruker AFMs:
    • Dimension FastScan®
    • Dimension FastScan Bio™
    • Dimension Icon®
    • Dimension Icon-Raman™
    • BioScope Resolve™
    • MultiMode® 8
    • Dimension Edge™

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/modes/modes/imaging-modes/peakforce-tapping/overview.html

  • (1) STYLUS PROFILER
    Dektak XT

    The Gold Standard in Stylus Profilometry

    The DektakXT® stylus profiler features a revolutionary design that enables unmatched repeatability of 4Å and up to 40% improved scanning speeds. This major milestone combined with its other breakthroughs, uniquely enable the DektakXT to perform the critical nanometer-level film, step and surface measurements needed to power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets.

    Over Forty Years of Profiling Innovation
    The Dektak brand boasts the first profiler for thin film measurements, the first microprocessor-based profiler, the first profiler with 3D capability, the first PC-based profiler, and the first automated 300mm profiler. Now, DektakXT continues this legacy of pioneering “firsts” as the first stylus profiler to implement a single-arch design, the first to incorporate a true-color HD optical camera, and the first to harness 64-bit parallel processing architecture to achieve optimal measurement and operating efficiency.

    Speeding Up Collection and Analysis
    Utilizing a unique direct-drive scan stage, the DektakXT accelerates measurement scan times by 40% while maintaining industry-leading quality. Vision64, Bruker’s 64-bit parallel processing operation and analysis software, enables faster loading of 3D files and faster applications of filters and multiscan database analyses.

    Delivering Repeatable Measurements
    Implementing a single-arch structure makes the DektakXT sturdier, which reduces sources of environmental noise. DektakXT’s upgraded “smart electronics” reduce temperature variations and employ modern processors that minimize error-inducing noise, allowing it to be an even more robust system capable of measuring <10nm step heights.

    Perfecting Operation and Analysis
    Bruker’s Vision64 software complements DektakXT’s innovative design by providing the most intuitive and streamlined visual user interface. The combination of intelligent architecture and customizable automation capabilities allow for fast and comprehensive data collection and analysis. Whether you’re using a recipe to perform routine analysis on single scans, or applying custom filters settings and calculations, DektakXT’s Data Analyzer displays current data while also revealing other possible analyses.

    Making Things Easy
    The DektakXT’s self-aligning styli and assembly allows the user to quickly and easily change stylus tip size while eliminating any potential mishaps during the process. Bruker offers the widest range of stylus sizes to accommodate nearly any application need.

    Ensuring High Yield
    DektakXT provides the ability to quickly and easily set up and run automated multi-site measurement routines to verify the precise thickness of thin films across the wafer surface with unmatched repeatability. This close monitoring can save valuable time and money by improving yields.

    Unmatched performance and better than 4Å repeatability
    The Dektak XT features an innovative single-arch design that delivers breakthrough platform stability. This is combined with leading-edge "smart electronics" that establish a new low-noise benchmark for stylus profiling. Finally, the Dektak XT’s new hardware configuration offers 40% shorter collection times than prior generations.

    Unprecedented efficiency and ease of use
    The Dektak XT is equipped with Bruker’s intuitive Vision64™ user interface, which simplifies workflow and operation to make the profiler easier than ever to use for advanced analysis. In addition, the system’s self-aligning styli enables effortless tip exchange, while the profiler’s single sensor design enables the widest range of capabilities in a single platform.

    Incomparable value from the world leader in stylus profilers
    In addition to premier performance in an affordable package, the Dektak XT is available with the full complement of accessories to extend versatility and tailor the system to your specific application.
    Building on the knowledge and experience from more than forty years of stylus profiling innovations, the Dektak XT incorporates a powerful combination of industry firsts, including a unique single-arch design and smart electronics for unmatched repeatability and performance, HD true color camera for enhanced image resolution and clarity, and a 64-bit parallel processing software architecture.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/stylus-profilometers/dektak-xt/overview.html

  • (2) AFM / FAST SCAN
    Dimension Fastscan

    The Dimension FastScan® delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Delivering High Performance on Any AFM Sample
    • Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift
    • Sample from subnanometer to hundreds of nanometers in height without loss of resolution

    Whether using the Icon scanner with ultra-low noise and high accuracy, or employing the FastScan scanner for high scan rates, the Dimension FastScan system will expand your laboratory’s capabilities beyond that of any other single instrument you can purchase.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-fastscan/overview.html

  • (2) STYLUS PROFILER / LARGE SAMPLE
    Dektak XTL

    Large-Format Wafer and Panel Measurement
    The Dektak XTL™ stylus profiler provides extremely accurate, repeatable, and reproducible metrology for a wide range of applications. With its ability to accommodate samples up to 350mm x 350mm, this system finally brings legendary Dektak performance to 200mm and 300mm wafer manufacturing.

    The Dektak XTL features a small footprint and integrated isolation with interlocking doors, making it ideal for today's demanding production floor environments. Its dual-camera architecture enables enhanced spatial awareness, and its high level of automation enhances manufacturing throughput. Bruker's exclusive Vision64 advanced production interface with optional pattern recognition makes data collection an intuitive and repeatable process, and minimizes operator-to-operator variability.

    New software features make the Dektak XTL the most powerful, easiest to use stylus profiler available. The system utilizes Vision64 software that is fully compatible with Bruker’s optical profiler line. The Vision64 software enables unlimited measurement sites, 3D mapping, and highly customized characterization with hundreds of built-in analysis tools.

    Also use Vision Microform software to measure shapes such as radius of curvature. Use pattern recognition to minimize operator error and enhance measurement location accuracy. Data collection and 2D and 3D analysis are in one software package with an intuitive flow. Each system comes with a Vision software license which can be installed on a separate PC with Windows 7 OS so data analysis and reports can be created at your desk.

    With its unique combination of superior performance and ease of use the Dektak XTL is the new standard for industrial thin film deposition monitoring in touch-panel, solar, flat panel display and semiconductor industries for research and QA/QC.

    Analyzes large samples
    • Encoded 300mm X/Y stage
    • Accommodates 200 & 300mm wafers
    • Up to 350mm x 350mm panels

    Industrial design
    • Integrated isolation platform
    • Incorporated keyboard/monitor
    • Small footprint workstation

    Optimized features for QA/QC
    • Pattern recognition
    • Advanced production interface
    • Interlocked doors
    • Localized GUI
    • Auto-ready kit for SECS/GEM

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/stylus-profilometers/dektak-xtl/overview.html

  • (3) AFM / LIFE SCIENCE / FAST SCAN
    Dimension Fastscan Bio

    The Dimension FastScan Bio™ Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.

    These breakthroughs allow many more researchers to observe and study the mechanisms biomolecular machines utilize to perform their biological functions. FastScan Bio’s high-resolution and high-speed scanning provide the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.

    Greatest Productivity Seen on Any AFM
    „„• FastScan Bio enables high-speed scanning, in conjunction with a seamless user interface for panning, zooming and continuous tracking of samples in fluid to render faster results.
    „„• A single-scan speed slider facilitates immediate access to scan rate control without the complexity of multiparametric adjustment.
    „„• On-board data and image manipulation tools present final data as high-resolution AFM images or experiment session movies.

    Immediate Path to Data Collection on Live Samples
    • „„Smart Engage algorithms take ambiguity out of the experiment process and provide flexibility for commercially available or custom-made probes.
    „„• User interface controls automate laser and detector alignment with a comprehensive workflow for faster time to data.
    • „„Quick sample engaging and immediate imaging are routine.

    More Options to Optimize Biological AFM Experiments
    „„• Innovative FastScan AFM technology enables high-speed scanning and a seamless user interface to render immediate panning, zooming and continuous tracking of samples in fluid.
    „„• FastScan Bio AFM allows direct visualization of biomolecules with an unprecedented combination of spatial and time resolution.

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-fastscan-bio/overview.html

  • (3) TRIBOLOGY / MECHANICAL TESTING / CMP
    TriboLab CMP

    Small R&D-Scale Specialty System for CMP

    Polishing Process Control for Process Development and Materials Testing
    The new TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes.
    • Reproduces full-scale wafer polishing process conditions without downtime on production equipment
    • Provides unmatched measurement repeatability and detail
    • Allows testing on small coupons for substantial cost savings over whole-wafer testing

    The Standard for Mechanical Test Labs
    Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab™ platform. TriboLab CMP is the only process development tool on the market that can provide a broad range of polishing pressures (0.05 - 50 psi), speeds (1 to 500 rpm), friction, acoustic emissions, and surface temperature measurements for accurate characterization of CMP processes and consumables.

    On-board Diagnostics for Better Understanding of Polishing Processes
    • Delivers more visibility into transient polishing properties than any other system on the market
    • Collects data from the instant the substrate touches the pad and throughout the entire test
    • Enables early-stage process development decisions through more complete, detailed data

    Flexibility in Sample Type, Size, and Mounting Configurations
    • Polishes any flat material, using virtually any conditioning disc, any slurry, and any pad
    • Accomodates small coupons through whole 100mm wafers with ease
    • Accepts multiple sample mounts for flexibility


    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/tribometers-and-mechanical-testers/tribolab-cmp-process-and-material-characterization-system/overview.html

  • (4) AFM / LIFE SCIENCE / FLUORESCENCE
    BioScope Resolve

    The BioAFM with Highest Resolution and Most Complete Biomechanics
    The BioScope Resolve™ BioAFM provides the highest resolution imaging, most complete biomechanics capabilities, and fastest scanning of any bioAFM available. Specifically designed for integration onto inverted optical light and confocal microscopes, it enables investigation of a wide range of biological samples, from cells and tissues to molecular and protein structures. The New MIROView™ interface provides unique data sets by combining AFM biomechanics data with real-time confocal and fluorescence microscopy.

    Unrivalled AFM and Optical Synchronization Capabilities
    BioScope Resolve's seamless integration of atomic force microscopy and light microscopy reveals more detail and information of biological samples including mechanical properties. The system's unique design makes combined optical and AFM research easy with its open access to the sample, single instrument setup, and correlated data collection and analysis. Researchers can now perfectly connect real-time optical images with AFM imaging.

    The new MIROView graphical interface and ScanAsyst-Cell mode ensure expert data generation, regardless of the user’s AFM experience level. Other features include:
    • Integrates with all major microscope models and optical techniques
    • Single, integrated view and operation controls for AFM or optical microscope
    • Syncronized AFM images, force maps and single force curves with optical images and data
    • Point-and-click setup for automated force and imaging measurements
    • Video creation of experiments showing optical and AFM results
    • BioAFM accessories and PeakForce Tapping probes to meet every application
    • PeakForce Modes

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/bioscope-resolve/overview.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension XR

    Dimension XR – Enabling First-and-Only AFM Capabilities and Performance
    Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation to deliver the utmost performance, functionality, and capability in nanoscale investigation. The extreme research (XR) family of SPMs for FastScan® and Icon® AFM platforms provides unique packaged solutions for advanced research in nanomechanical, nanoelectrical, and nanoelectrochemical characterization. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier.

    • Quantitative Analysis for Nanomechanical Applications
    • Multi-Dimensional Nanoelectrical Characterization
    • Highest Resolution Scanning Electrochemical Imaging
    • Unlimited Flexibility to Expand Your Research

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-xr/overview.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension Icon

    Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This level of performance has established the new generation of what Atomic Force Microscopy should be.

    Ultimate Performance
    • Proprietary sensor design achieves closed-loop performance with noise levels for previously unseen on any AFM
    • Significantly reduced noise floor at less than 30pm enabling imaging at sub-nanometer resolution
    • Drift rates less than 200pm per minute render distortion-free images immediately

    Enhanced Nanoscale Automation
    Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

    Exceptional Productivity
    • Integrated alignment tools deliver quick and optimized probe positioning
    • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
    • ScanAsyst® Imaging and NanoScope® software with default experiment modes distill decades of knowledge into preconfigured settings

    Superior Versatility
    • Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
    • Most sensitive and complete nanoscale mapping of permittivity and conductivity with PeakForce sMIM™
    • Instrument and software designed to take full advantage of all current and future Bruker AFM modes and techniques
    • Custom user-programmable scripts offer semi-automated measurement and analysis

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon/overview.html

  • AFM / ENTRY LEVEL
    Innova

    The Best-Value Research AFM

    Providing complete AFM capabilities to fit your budget
    The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.

    Optimized for Performance
    All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultra-low noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultra-low noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid.

    High-Resolution System
    • Utilizes an innovative design optimized for lowest closed-loop noise and drift
    • Ensures accurate measurements at all scales and in all dimensions
    • Delivers highest resolution results with great ease

    Fast Setup for Every Experiment
    • Provide fastest hardware setup via ergonomic open stage and premounted cantilever option
    • Ensures fast and precise region of interest identification with software-controlled high-NA optics
    • Distills decades of AFM expertise into preconfigured software settings
    • Enables seamless operation from survey to atomic resolution

    Powerful Research Flexibility
    • Addresses all advanced measurements with full range of SPM modes
    • Customizes research with configurable signal access and physical access to tip-sample junction
    • Offers nano-optics with TERS-enabled AFM-Raman integration

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/innova/overview.html

  • AFM / IR
    Anasys NanoIR3

    Nanoscale Infrared Spectroscopy | nanoIR

    Bruker Anasys Instruments is the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales. We are dedicated to delivering innovative products and solutions that measure spatially varying physical and chemical properties with nanoscale spatial resolution in a diverse range of fields, including polymers, 2D materials, materials science, life science and micro-electronics industry.

    Anasys nanoIR products have been adopted by leading scientists at major research universities, national laboratories and leading chemical/materials companies worldwide. With an impressive and growing publication record, our customers have proven the ease of use and productivity in real-world applications.

    nanoIR3
    The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications.

    • True model free nanoscale IR absorption spectroscopy
    • 10nm resolution chemical imaging with Tapping AFM-IR
    • FAST spectra AFM-IR provides high resolution, nanoIR spectroscopy in seconds
    • Rich, interpretable IR spectra that directly correlates to FTIR
    • Correlative microscopy with nanoscale property mapping and full featured AFM
    • "Anasys engineered" for ease of use, productivity and reliability

    nanoIR3-s
    The nanoIR3-s draws on a legacy of award winning products and represents the state of the art for nanoscale spectroscopy, imaging and materials analysis.

    • Two complementary nanoscale IR techniques – s-SNOM and AFM-IR
    • 10nm resolution chemical and optical property mapping
    • nano FTIR high performance broadband spectroscopy
    • Correlative microscopy with nanoscale property mapping and full featured AFM
    • "Anasys engineered" for ease of use, productivity and reliability

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/nanoscale-infrared-spectrometers.html

  • AFM / LARGE SAMPLE
    Dimension Edge

    The Best Value High-Performance AFM

    Best-in-class AFM capabilities to match all research budget levels
    Dimension Edge™ leverages the many innovations of the Dimension Icon® System to provide levels of performance and functionality only available from Bruker. At the heart of this system’s capabilities is Bruker’s revolutionary closed-loop tip scanner, which reduces closed-loop positioning noise levels to the length scale of a single chemical bond.

    Highest Productivity for Any User
    • Proprietary ScanAsyst imaging enables instant expert results
    • High-resolution, 5MP camera and integrated stage control provide fast sample navigation and efficient multi-site measurments
    • Linear workflow and seamless transition from survey to highest resolution delivers accurate results in a short time

    Best Value Closed-Loop Dimension AFM
    • Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
    • Significantly reduced noise and drift values bring small-sample imaging performance to a large-sample AFM
    • Modular microscope and electronics design enable high image fidelity at moderate cost

    Solutions for All Applications on Any Sample
    • Open stage access accommodates wide variety of experiments and samples
    • New instrument design and software take full advantage of Bruker's full suite of AFM modes, including advanced electrical and electrochemical applications
    • Built-in access to signal routing enables custom measurements to take research in new directions

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-edge/overview.html

  • AFM / LIFE SCIENCE
    JPK NanoWizard® AFM

    Specialized solutions for applications ranging from BioAFM and Polymer Research to Surface Science and NanoOptics

    The NanoWizard® is the most flexible high-end AFM on the market. It sets the benchmark in resolution, speed and stability in particular for fluid applications. All NanoWizard® systems provide true integration of AFM with optical microscopy by means of our patented DirectOverlay™ feature for precise and easy work, and comes with a large variety of options and accessories. In addition, the NanoWizard® family comes with the QI™ Mode, an easy and intuitive imaging mode for quantitative imaging.

    NanoWizard® 4 BioScience AFM
    For applications in Life Science and Soft Matter research on single molecules, living cells and tissues. The system combines highest usability with high-quality measurements. Cutting-edge technology from the pioneers of BioAFM.

    NanoWizard® 4 NanoScience AFM
    For applications in materials and polymer science ranging from nanomechanics and electrochemistry to electrical and magnetic measurements.

    BioMAT™ Workstation
    For opaque samples, combining upright optical microscopy with AFM for surface science and life science.

    NanoWizard® Sense AFM
    The best start in AFM for applications in materials and life science.

    NanoWizard® ULTRA Speed 2 AFM
    High-speed imaging and super-resolution AFM on inverted microscopes, paired with unparalleled flexibility.

    NanoWizard® NanoOptics AFM
    Comprehensive solution for advanced experiments which combine AFM and optical spectroscopy such as TERS, Aperture SNOM and sSNOM, confocal microscopy and nano manipulation in optical fields.

    OT-AFM Combi-System
    NanoTracker™ & NanoWizard® - Powerful combination of Optical Tweezers & AFM in one system for force measurements in 2D and 3D from 500fN to 10nN.

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy

  • AFM / LIFE SCIENCE / INVERTED MICROSCOPE
    NanoWizard® ULTRA Speed 2 AFM

    A new benchmark: True atomic resolution and high-speed imaging with 10 frames/sec

    The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes the system highly flexible and upgradable.

    The NanoWizard ULTRA Speed 2 provides a range of new features:
    • NestedScanner Technology for high-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    • PeakForce Tapping® for easy imaging
    • New tiling functionality for automated mapping of large sample areas
    • V7 Software with revolutionary new workflow-based user interface
    • DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms
    • Vortis™ 2 controller for high-speed signal processing and lowest noise levels

    High-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    The system comes with the lowest noise and highest stability available on the market to provide true atomic resolution. Direct force control at ultra-low forces prevents damage to your samples and probes. With the state-of-the-art position sensor technology, the system delivers highest accuracy and maximum precision.

    Until now, performing dynamic experiments on living cells, highly corrugated samples or steep surface structures with highest spatial and temporal resolution was challenging. With our new NestedScanner technology, cells, bacteria or structured surfaces with samples heights up to 8µm can now be examined at the highest scan speeds.

    • Observe sample dynamics in real-time with highest resolution
    • Access to corrugated and higher surfaces with the NestedScanner technology
    • Combine AFM and optical fluorescence microscopy for multiparametric in-situ experiments
    • Enhance productivity, probe more sample positions faster

    Key features
    • High-speed imaging with 10 frames/sec with excellent resolution
    • Now with Bruker’s exclusive PeakForce Tapping as standard
    • Revolutionary new workflow-based user interface for ergonomics and ease of operation
    • New tiling functionality for automated mapping of large sample areas together with the HybridStage
    • Unique integration with optical microscopy by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy
    • New Vortis 2 controller with high-speed low-noise DACs and cutting-edge position sensor readout technology
    • Highest flexibility and upgradeability with a broad range of modes and accessories

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy/nanowizard-ultra-speed-2

  • AFM / MATERIALS / FLEXIBLE MODES
    MultiMode 8-HR

    Designed for Performance
    The legendary performance and reliability of the MultiMode platform is the result of both its superior mechanical design and the industry’s lowest noise control electronics. The secret to its continued presence at the leading edge of AFM research is its ability to incorporate all the latest technology advances.

    Faster and More Productive
    • The NEW high-speed ScanAsyst-HR is now available, enabling fast scanning on the MultiMode 8-HR AFM system
    • 20X faster survey scan rates and up to 6X faster scans with no loss of resolution

    Versatility to Satisfy More Applications
    • TThe MultiMode 8-HR AFM is equally well suited for imaging in both air and fluid
    • Heating to 250°C, cooling to -35°C with temperature control accessories
    • A large variety of standard operating modes and many unique capabilities enable the MultiMode 8-HR AFM system to characterize everything from mechanical to electrical properties

    Easier Expert-Quality Results
    • Bruker's proprietary ScanAsyst atomic force microscopy scan technology mode offers automatic image optimization, continuously adjust scan rate, setpoint and gains to obtain the highest quality image and to deliver faster, more consistent results
    • Imaging in fluid has never been easier with no need for cantilever tuning and with ScanAsyst continuously monitoring the tip-sample interaction force, thereby eliminating setpoint drift

    Exclusive & Powerful Quantitative Imaging Modes
    • PeakForce QNM enables direct mapping of nanomechanical properties, including elastic modulus, adhesion and dissipation, at high resolution and normal scan rates
    • PeakForce TUNA™ enables quantitative conductivity mapping on delicate samples that can't be imaged with conventional conductive AFM

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/multimode-8-hr/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Dimension Icon-Raman

    Highest Performance AFM with Co-Localized Micro-Raman Capability

    Incorporating the industry-leading AFM and a research-grade confocal Raman microscope on a single platform.
    With the introduction of integrated Raman spectroscopy capability, Bruker's Dimension Icon® platform again sets a new standard in high-performance surface characterization, enabling colocalized measurements with unsurpassed efficiency and ease.

    The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample.

    When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

    The Dimension Icon AFM-Raman system, consisting of the Icon AFM and a research-grade confocal Raman microscope (Horiba, LabRam, etc.), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument’s full functionality, providing optimum combined performance.

    Key Features
    • Fully integrated system delivers convenient correlation of advanced AFM data with information on chemical composition or crystallographic structure
    • High-resolution X-Y stage permits fast and accurate positioning between the AFM and Raman microscope
    • Full range of AFM capabilities provides more features than any other system
    • PeakForce QNM® enables quantitative nanoscale mechanical property mapping
    • „„Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
    • „„ScanAsyst® enables dramatically more productive imaging with fully automatic parameter optimization, guaranteeing best results on the most delicate samples

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-icon-raman/overview.html

  • AFM / RAMAN / CHEMICAL ANALYSIS
    Innova-IRIS

    The Most Complete TERS Solution

    Enabling highest performance AFM-Raman research
    Bruker’s Innova-IRIS (Integrated AFM-Raman Imaging System) enables the emerging technique of tip-enhanced Raman spectroscopy (TERS), seamlessly blending atomic force microscopy and Raman spectroscopy.
    • Delivering high-performance TERS with complete SPM capabilities
    • Offering performance exclusively enabled by Bruker's commercially available TERS probes
    • Providing productive measurement with guaranteed TERS performance

    Innova - The Best Place to Start Your AFM Research
    This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.

    Providing Complete AFM Capabilities
    All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid. With closed-loop noise levels approaching those of open-loop operation, superior image quality is achieved from the full 90-micron scan range down to submicron images on any sample, whether it is a semiconductor, a soft and nanostructured material, or DNA.
    In addition, closed-loop scan linearization can be activated and deactivated on the fly.This incredible flexibility allows zooming down to atomic resolution on any selected portion of a full size scan, without changing scanner hardware and without withdrawing the probe from the surface.

    Fast Setup for Every Experiment
    The patented top-down optics of the Innova integrate seamlessly with all imaging modes. With softwarecontrolled optical zoom, they provide a broad range of magnification, allowing for a direct view of the cantilever and sample with better than 1-micron resolution to identify the smallest sample features and ensure precise probe positioning. With the optics positioned entirely inside the protective instrument cover, probe and sample can be viewed at any time while insolating the instrument from the environment. The ergonomic integration of the optics with the microscope also contributes to the ease and accuracy of tip exchange and laser alignment. The user can simply drop in a new tip and swing the optics back into place. The pre-aligned cantilever will always remain in focus.
    Innova has also been specifically designed to provide quick and easy tip exchange and alignment. The Innova head rests kinematically on three independently controlled motors that allow height, pitch, and tilt adjustments relative to the sample, and user-defined positions can move the head in sub-micron increments. In addition, the system comes complete with a universal chip carrier that accepts almost any unmounted cantilever.

    Easiest to Use AFM for Spectroscopy in Nanostructured Materials
    • Ergonomic hardware and streamlined software with integrated setup diagnostics deliver instant research quality results
    • Experiment Selector” distills decades of knowledge into preconfigured settings, mitigating the complexity of traditional TERS setups

    Highest Performance, Most Complete AFM Capabilities
    • Fully featured suite of advanced topographic, electrical, mechanical, and thermal AFM capabilities enables correlated property mapping
    • System design for noise and drift elimination enables high-resolution imaging and long Raman integration times

    True Nanoscale Spectroscopy Targeted to Your Application
    • Modular accessories tailor system to targeted applications
    • Optimized optical access enables capture of weak Raman signals for nanoscale chemical mapping, even on challenging samples

    The Most Complete TERS Solution
    • Innova-IRIS is compatible with Bruker's new high-contrast IRIS TERS probes, providing a complete TERS solution with highest sensitivity and spatial resolution

    For more information, please visit:
    https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/innova-iris/overview.html

  • AUGER ELECTRON SPECTROSCOPY (AES) / SURFACE ANALYSIS / SPECTRAL ANALYSIS
    PHI 710

    Auger Electron Spectroscopy (AES, Auger) is an analytical technique that provides compositional and distributional information of elements on the top few monolayers of a material by irradiating an electron beam to the surface of a solid material and measuring the energy of Auger electron emitted from the sample surface. The PHI 710 Scanning Auger Nanoprobe is a high performance surface analysis system that provides nanometer level Auger analysis. The acoustic enclosure and the built-in vibration isolators allow compositional and distributional measurement by 500,000 magnification that conventional Auger system never achieved.

  • DUAL BEAM / SEM / FIB / EXTREME HIGH RESOLUTION (XHR)
    Helios Nanolab

    The Helios NanoLab™ DualBeam™ has always combined FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology's leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.

    With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements.

  • DUAL BEAM / SEM / FIB / ULTRA HIGH RESOLUTION (UHR)
    Scios Dual Beam

    FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, the FEI Scios is ideal for advanced research and analysis across academic, government, and industrial research environments.

    Advanced detection technology is at the very core of the FEI Scios. In-lens FEI Trinity™ detection technology collects all signals simultaneously, saving time and offering distinctly different contrasts to capture the maximum amount of data. An innovative, under-the-lens concentric backscatter detector enhances efficiency, enabling you to select a signal based on its angular distribution to easily separate materials and topographic contrast-even at 20 eV landing energy.

  • Life Science, EV, Biomaker, Particlemetrix, Fluorescence, NTA, Nano Tracking Analysis, Nano Technology
    ZetaView® BASIC NTA - Nanoparticle Tracking Video Microscope PMX-120

    For the analysis of size, concentration, fluorescence, electrophoretic mobility and sub-populations of individual nanoparticles.

    Nanoparticle Tracking Analysis (NTA) captures the Brownian motion of each particle in the video. Based on the different diffusion movements of large and small particles in the surrounding liquid, the hydrodynamic diameter of the particles is determined. Furthermore, the charge state of the particle surface (zeta potential) can be measured via the movement of the particles in an applied electric field.

    Pattern parameters, such as intensity fluctuations, surface geometry and shape of the particles as well as particle concentration are documented at each recording and can be used to distinguish sub-populations.

    All these analyzes are carried out quickly and statistically reliably as required in the scattered light or fluorescence mode.

    Antibody-conjugated EVs can be differentiated from membrane-enveloped vesicles labeled with corresponding intercalating dyes.

    Depending on the type of sample and the measuring mode, the measuring range is between 15 nm and 5 μm.

  • life science, EV, biomaker, particlemetrix, fluorescence, NTA, nano tracking analysis, nano technology
    ZetaView® BASIC NTA - Nanoparticle Tracking Video Microscope PMX-120

    "For the analysis of size, concentration, fluorescence, electrophoretic mobility and sub-populations of individual nanoparticles.

    Nanoparticle Tracking Analysis (NTA) captures the Brownian motion of each particle in the video. Based on the different diffusion movements of large and small particles in the surrounding liquid, the hydrodynamic diameter of the particles is determined. Furthermore, the charge state of the particle surface (zeta potential) can be measured via the movement of the particles in an applied electric field.

    Pattern parameters, such as intensity fluctuations, surface geometry and shape of the particles as well as particle concentration are documented at each recording and can be used to distinguish sub-populations.

    All these analyzes are carried out quickly and statistically reliably as required in the scattered light or fluorescence mode.

    Antibody-conjugated EVs can be differentiated from membrane-enveloped vesicles labeled with corresponding intercalating dyes.

    Depending on the type of sample and the measuring mode, the measuring range is between 15 nm and 5 μm."

  • MOLECULAR WEIGHT ANALYZER
    BI-MwA Molecular Weight Analyzers

    The BI-MwA Molecular Weight Analyzer is simple to use, but incorporates sophisticated features. Inject your sample into the low-volume, 7-angle flow cell. The sample is illuminated by a temperature stabilized, precision power-controlled diode laser. The ultra-stable, high-sensitivity, low-noise CCD detector automatically collects the scattered light. Then, the software extrapolates the data to zero angle for the absolute molecular weight determination.

  • MOLECULAR WEIGHT ANALYZER / DIFFERENTIAL REFRACTOMETER
    BI-DNDC Laser Light Scattering Instruments

    The BI-DNDC is a deflection type refractometer that may be used in either static or dynamic mode. In static mode, the specific refractive index increment, dn/dc, is determined. This value is required as a parameter in molecular weight measurements using light scattering. In dynamic mode dn/dc is already known, and the instrument is used as a concentration detector for HPLC and GPC applications.

  • Nanoprobing SEM Solution
    8-bot Nanoprobing

    Imina Technologies’ Nanoprobing SEM Solutions are turnkey for electrical characterization of microelectronic devices and in situ semiconductor failure analysis. Up to 8 nanoprobers can be delivered in various configurations to adapt to customer applications requirements and equipment. The circular platforms can either be mounted on the SEM sample positioning stage, or be loaded via the SEM load-lock. Best in class in situ preamplifiers and scan generators are compatible with the Nanoprobing Solutions to perform quantitative EBIC and low noise EBAC/RCI analyses.

    The miBot manipulator is a mobile micro-robot. It means that it moves directly over the surface of the base on which your sample lays and has no mounting screws. The manipulator can therefore be pre-positioned by hand, making it very fast to set-up and reconfigure.
    Moreover, no movements of the miBot manipulator are coupled. It makes it extremely intuitive to control, significantly reduces the time to achieve complex manipulation, and eliminates the risk of damaging samples.

    The easiness-of-use of the miBot manipulator enables anybody to be trained in a few minutes and quickly obtain results from his applications.

  • PARTICLE SIZE ANALYZER
    MicroBrook 2000L

    The MicroBrook 2000L utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

  • PARTICLE SIZE ANALYZER / MOLECULAR WEIGHT ANALYZER
    BI-200SM

    The Brookhaven Instruments’ BI-200SM system opens the door to the rich fields of exploration of both Static Light Scattering (SLS) and Dynamic Light Scattering (DLS).

    The BI-200SM Research Goniometer System provides access to these studies with an automatic, modular and versatile system. It is a precision
    instrument designed for exacting scattering measurements. Based on a special turntable with precision ball bearings and stepping motor, the BI-200SM’s modern design and quality construction guarantee precise measurements due to the wobblefree movement of the detector. It is field proven in thousands of laboratories. It is ideal for molecular studies and submicron particle sizing.

    Brookhaven Instruments’ scientists have extensive experience in the development of instruments and methods for light scattering and this experience has been incorporated into the BI-200SM to make it the finest instrument available for research applications of light scattering.

  • PARTICLE SIZE ANALYZER / NANO
    NanoDLS

    The NanoDLS is the gateway to absolute nanoparticle sizing including proteins and their aggregates (oligomers), polymers, dendrimers, micelles, and other colloidal materials. Either on-line (ASEC or SEC/GPC), or in batch-mode, it is an excellent tool for determination of hydrodynamic radii from 0.5 to a few microns.

    Based on the principles of dynamic light scattering, the NanoDLS uses an automatic, variable-power laser at 638 nm, maximum 35 mW power, an optical cell design, a singlemode fiber, a self-protecting avalanche photodiode and a 25ns/522 channel digital autocorrelator. Due to the optical cell, the NanoDLS can measure samples from extremely low to high concentrations. Such a design allows for small volumes and a vertical flow pattern, minimizing the effects of bubbles.

    For globular proteins and other rate samples, sizes are often small and concentrations low. Because of its unique optical cell design, the NanoDLS makes obtaining reliable data from such samples easy. In addition aggregate (oligomer) formation is readily probed because light scattering is supremely sensitive to small amounts of larger particles.

  • PARTICLE SIZE ANALYZER / WET & DRY SAMPLES
    MicroBrook 2000LD

    The MicroBrook 2000LD utilizes a unique single-beam, dual-lens system that receives all the scattered signals emitted from particles in the nanometer to millimeter size range. Employing the highest quality lenses results in high resolution imaging of the diffracted and scattered light with low distortion, ensuring that the instrument will receive all signals – even weak signals at high angles from scattering of the smallest particles.

  • PARTICLE SIZE ANALYZER / X-RAY DISC CENTRIFUGE
    BI-XDC

    By providing both centrifugal and gravitational sedimentation in one instrument the BI-XDC brings these well established methods of particle sizing up to date for today's fine particle technology. With an X-ray technology to give error free measurements, fast and accurate size distributions across the ""one-micron"" transition region are easily obtained. Now, with a single instrument you can get true high resolution, accurate, particle size distributions from 10 nanometers right up to 100 microns. Brookhaven's advanced scanning detector technology and wide disc speed range lets you optimize analysis times and broaden the range of samples you can analyze.

    With the Brookhaven Bl-XDC there are no optical corrections and no optical properties to worry about, just a simple mass sensitive response based on X-ray absorption.

  • PARTICLE SIZE ANALYZER / ZETA POTENTIAL ANALYZERS
    NanoBrook Series

    "Characterizing proteins, nanoparticles & polymers confronts the user with a difficult choice of instrumentation. Now Brookhaven Instruments makes that choice easier with its NEW NanoBrook Family. Choose from particle sizing including backscatter for proteins, zeta potential, or combinations including molecular weight determination of small polymers and proteins.

    Particle Sizing and Zeta Potential Combination Instruments
    Select the Omni for sizing proteins, colloids, polymers, and nanoparticles over the entire range and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
    Select the 90Plus PALS for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination of proteins, nanoparticles and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids.
    Select the 90Plus Zeta for sizing colloids and nanoparticles with diameters greater than 10 nm and for zeta potential determination in water with salt concentrations up to 75 millimolar ionic strength.

    Particle Sizing
    Select the 90Plus for sizing colloids and nanoparticles with diameters greater than 10 nm.
    Select the 173 for sizing of globular proteins and small polymers as low as 1 nm hydrodynamic radius.
    Select the 173Plus for sizing proteins, colloids, polymers and, nanoparticles over the entire range.

    Zeta Potential
    Select the ZetaPlus for zeta potential determination of nanoparticles and colloids in water with salt concentrations less than 75 millimolar ionic strength.
    Select the ZetaPALS for zeta potential determination of proteins, nanoparticles, and colloids in water with salt concentrations up to 2 M ionic strength and in nonpolar or viscous liquids."

  • Raman, Spectroscopy, Nanotechnology, 2D material, 3D material, Graphene
    inVia™ Qontor® confocal Raman microscope

    The new inVia Qontor is Renishaw's most advanced Raman microscope. With the addition of Renishaw's latest innovation, LiveTrack™ focus tracking technology, the inVia Qontor enables users to analyse samples with uneven, curved or rough surfaces. Optimum focus is maintained in real time during data collection and white light video viewing. This removes the need for time consuming manual focusing, pre-scanning or sample preparation.

    The inVia Qontor confocal Raman microscope's cutting-edge technology reduces overall experiment times and makes analysing even the most complex samples easy.

    Keep your view of the sample in focus while you survey it under manual control
    Raman-map rough, uneven, and curved surfaces
    Little or no sample preparation is required
    View Raman chemical images in 3D and see both the chemistry and the topography
    No need for a time-consuming surface pre-scan
    Maintain focus during dynamic measurements, such as sample heating/cooling and during very long measurements when the environmental conditions are varying

  • REAL-TIME PROBING / NANOPROBE
    Nanoprobing SEM Solutions

    Platforms with mobile robots
    1-8 units
    Driving electronics
    Control software
    Flange with feedthroughsconnectors
    Stage adaptor
    Compatible with most of the SEM
    even with the smallest chambers
    Fast installation/removal of the system: no need for a dedicated SEM
    5-10 min

  • REAL-TIME PROBING / NANOPROBE / COMPACT
    Compact Solution Package

    Their mounting interfaces are compatible with standard optical breadboards and microscope stages,allowing you to easily reconfigure your setup for new experiments. Not directly attached to the sample, these stages are ideal for use at low optical working distance. They are also well adapted to contact large substrates mounted on sample holders that are moved by a positioning stage (e.g. wafer chucks, Petri dishes).

  • REAL-TIME PROBING / NANOPROBE / PORTABLE
    Portable Solution Package

    Versatile. 4 manipulators, 1 platform, multiple microscopes.
    Faster experiments. Observe, prepare and characterize your samples at once.
    Hassle-free probe positioning. Instantly adjust the orientation to any sample geometries.
    High mechanical stability. Move without vibration and maintain steady electrical contacts.

  • SEM / ENVIRONMENT SEM
    Quanta

    The FEI Quanta line includes six variable-pressure and environmental scanning electron microscopes (ESEM™). All of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.

    The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.

  • SEM / EXTREME HIGH RESOLUTION (XHR)
    Verios XHR SEM

    The Verios is the second generation of FEI’s leading XHR (extreme high resolution) SEM family. It provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).

  • SEM / ULTRA HIGH RESOLUTION (UHR)
    Teneo

    For metals researchers, academic and industrial research institutions, FEI's Teneo SEM provides Ultra High Resolution imaging together with the highest throughput analytical performance.

    A revolution in detection - the unique TrinityTM detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images. With three separate in-lens detectors operating simultaneously with the standard chamber detector, simultaneous detection from all angles can be performed, saving time, maximizing information and preventing sample contamination and damage.

  • SEM / ULTRA HIGH RESOLUTION (UHR)
    Nova Nano

    The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in your laboratory, the Nova NanoSEM enables owners the ability to gain the most comprehensive answers in the least amount of time. This propels productivity, without sacrificing on the quality imaging you demand from your daily work.

    With the Nova NanoSEM 50 series, even more becomes possible. In addition to the powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration, the Nova NanoSEM 50 series introduces a new suite of latest generation, high sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to best optimize the information of interest. Intelligent scanning modes are available to minimize imaging artifacts.

  • SPR
    BI-2000 Series

    • Innovative multi-module design
    Provides users with maximum flexibility to choose amongst various analysis modules for diverse applications

    • Compatible with electrochemistry and chemical vapor applications
    Allows for electrochemical SPR studies, chemical vapor detection, gas chemical sensor research, and fundamental solid-gas interface studies (gas module exclusive to BI-2000G model)

    • Two-channel SPR detection module
    For background and reference subtraction in aqueous buffer solution; covers SPR angle range for measuring SPR shift

    • Single and dual channel flow modes
    Allows for more experimental options and enhanced data quality

    • Wide dynamic range and high sensitivity
    High sensitivity (<10-4 degrees) for both large and small molecules (<100 Daltons) enables users to measure binding constants down to a few pM-1

    • Broad response time
    For slow (hours) and fast (< ms) kinetic processes

  • SPR
    BI-3000 Series

    • Semi-automated sample delivery with BI-DirectFlow™ technology
    For ultra-fast kinetics, distinction/extraction of secondary effects, and higher quality results

    • Innovative multi-module design
    Provides users with maximum flexibility to choose amongst various analysis modules for diverse applications

    • Compatible with electrochemistry and chemical vapor applications
    Allows for electrochemical SPR studies, chemical vapor detection, gas chemical sensor research, and fundamental solid-gas interface studies (chemical vapor applications exclusive to BI-3000G model)

    • Two-channel SPR detection module
    Covers wide SPR angle range for measuring SPR shift in liquid and gas phases. Also capable of accurate background and reference subtraction.

    • Single and dual channel flow modes
    Allows for more experimental options and enhanced data quality

    • Wide dynamic range and high sensitivity
    High sensitivity (<10-5 degrees) for both large and small molecules (<100 Daltons) enables users to measure binding constants down to a few pM-1

    • Broad response time
    For slow (hours) and fast (< 0.5 ms) kinetic processes

  • SPR
    BI-4000 Series

    • Temperature controlled two-channel SPR detection module
    Covers wide SPR angle range for measuring SPR shift in liquid phase. Precision background and reference subtraction. Temperature control for thermodynamic studies, 6 to 50 °C.

    • Fully- and Semi-automated options with
    BI-DirectFlow™ Technology
    For ultra-fast kinetics, discernment of secondary effects, and generation of high quality results. Available in fully-automated option with BI Autosampler.

    • Innovative multi-module design
    Provides users with maximum flexibility to choose amongst various analysis modules for diverse applications

    • Compatible with electrochemistry applications
    Allows for electrochemical SPR studies and chemical sensor research.

    • Single and dual channel flow modes
    Allows for more experimental options and enhanced data quality

    • Wide dynamic range and high sensitivity
    High sensitivity (<10-5 degrees) for both large and small molecules (<100 Daltons) enables users to measure binding constants down to a few pM-1

    • Broad response time
    For slow (hours) and fast (< 0.5 ms) kinetic processes

  • TEM / ADVANCE / CRYO-TEM / STRUCTURAL BIOLOGY
    Titan Halo

    Based on the Titan Krios ultimate platform for biological imaging, Titan Halo combines versatility and flexibility with impressive, superior optical quality. Effective biological imaging at the nanoscale requires platforms which are able to take the lowest contrast, sensitive and valuable sample and turn it into revealing, insightful data. Titan Halo excels at delivering application versatility and flexibility without any compromise to optical stability.

  • TEM / ADVANCE / CRYO-TEM / STRUCTURAL BIOLOGY
    Titan Krios

    The Titan Krios is the most powerful and flexible high resolution electron microscope for 2D and 3D characterization of biological samples. The Titan Krios optimal thermal and mechanical stability ensures perfect optical performance. The Titan Krios enables days of unattended operation and the combination with the automated sample loader results in unprecedented sample throughput.

  • TEM / ADVANCE / ENVIRONMENTAL TEM
    Titan ETEM

    Environmental Transmission Electron Microscope for dynamic in situ exploration of functional nanomaterials and devices at the nanometer and atomic scale.

    Built on FEI's world class Titan TEM platform, the Titan ETEM G2 atomic-resolution Scanning/Transmission Electron Microscope (STEM) is an all-in-one solution for time-resolved in situ studies of dynamic behavior of nanomaterials during exposure to gaseous environments. FEI's newest ETEM generation features an innovative differentially-pumped specimen area compatible with standard TEM holders for easy sample handling and full double tilt capability. The software-controlled user interface offers a range of settings to accommodate both handling by novice as well as by advanced operators. A mass spectrometer allows determination of gas composition; a built-in plasma cleaner allows for cleaning after using a gas. Built with the utmost consideration to safe operation, the Titan ETEM G2 complies fully with safety regulations and protocols for gas handling. Titan ETEM G2 is a flexible, easy-to-use solution for imaging of static specimens, observing nanomaterials' dynamic response to the applied stimulus, and observing growth, function, reliability and breakdown of nanodevices.

  • TEM / ADVANCE / MATERIALS
    Titan Themis

    The best gets better. Titan Themis TEM builds on the proven Cs corrected Titan platform to deliver the fastest time to data and the best S/TEM image quality for rapid access to crystal clear atomic scale images. With new Velox™ software, Piezo stage and Ceta 16M camera, Themis provides the power and speed demanded by today's materials researchers to achieve success at the extreme edges of discovery.

  • TEM / CRYO-TEM / LIFE SCIENCE / STRUCTURAL BIOLOGY
    Tecnai Artica

    The next generation automated, high resolution imaging TEM platform - Tecnai Arctica provides a platform which combines excellent optical performance and thermal and mechanical stability with high sample throughput. This new platform delivers increased data throughput using a new sample holder that allows for automatic loading of 12 samples. This results in high data throughput coupled with superior optical performance and stability; researchers gain a dramatic reduction in time to data results and achieve lower costs per structure.

  • TEM / ELECTRONICS / INDUSTRIAL
    Metrios TEM

    The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. Extensive automation of the basic TEM operation and measurement procedures minimizes requirements for specialized operator training. Its advanced automated metrology routines deliver greater precision than manual methods. The Metrios TEM is designed to provide customers with improved throughput and lower cost-per-sample than other TEMs.

  • TEM / MATERIALS / LIFE SCIENCE
    Tecnai

    The FEI Tecnai™ transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries.

    With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.

  • TOF-SIMS / SURFACE ANALYSIS
    PHI nanoTOF II

    Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface analysis technique that provides compositions and images of surface molecules and elements with a top few atmic layers. TOF-SIMS can analyze from H+ to high mass number molecule ion (> 10.000amu) with a high mass resolution.
    PHI TRIFT V nanoTOF ™ achieves high spatial resolution and mass resolution by using triple focus hemispherical electrostatic analyzer which has excellent ion transmitting characteristics.PHI TRIFT V nanoTOF ™ also has high ability that can image samples with complex geometries without shadowing.

  • XPS / SURFACE ANALYSIS / AUTOMATED
    PHI Quanterra II

    The Quantera II is the next generation of PHI’s highly successful scanning XPS microprobe product line. The Quantera II provides high sensitivity large and micro-area spectroscopy, superior inorganic and organic depth profiling, and the fully automated analysis of insulating or conductive samples.

    Important features of the Quantera II include:
    High sensitivity large area spectroscopy
    High performance micro-area spectroscoy
    Patented scanning x-ray source with a < 7.5 µm minimum beam size
    Secondary electron and XPS imaging
    Highest performance inorganic and organic sputter depth profiling
    Optional C 60 sputter ion gun
    Hands-off dual beam charge neutralization
    Robust ""Auto-Z"" sample alignment
    Robotic sample handling
    Fully automated and internet ready for remote operation
    Micro area spectroscopy and high performance thin film analysis capabilities open new areas of application for XPS surface analysis in all environments. The complete automation of the system makes it easy to use and increases the reproducibility of routine measurements. Large sample platens make it possible to analyze “real world” large samples or multiple small samples automatically. A new generation of XPS surface analysis instruments are available today from PHI.

  • XPS / SURFACE ANALYSIS / MID-RANGE
    PHI X-Tool

    The PHI X-tool is the newest member of PHI’s suite of XPS instruments that also includes the PHI Quantera II and PHI VersaProbe II. The X-tool is designed to make XPS instrumentation accessible to a larger audience. An intuitive touch screen user interface, automatic sample loading, automatic analysis, and automatic report generation removes the requirement to be a surface analysis expert to perform XPS measurements.

    Based on PHI’s patented scanning XPS microprobe technology, the X-tool provides a robust environment for performing routine small and large area XPS measurements.

    In the automatic mode of operation a turnkey recipe driven analysis capability for repetitive analysis tasks or process monitoring is provided.

    In the interactive mode of operation, the user can define analysis conditions and guide an interactive research or failure analysis oriented analysis session. Analysis capabilities include: small and large area spectroscopy, XPS mapping, and sputter depth profiling. An internal optical microscope and x-ray beam induced secondary electron imaging are available to guide the selection of areas for analysis.

    If your XPS application is centered around repetitive analysis tasks or the need to make XPS available to a large group of users, the X-tool was designed for you.

  • XPS / SURFACE ANALYSIS / MULTI-TECHNIQUE
    PHI VersaProbe II

    The VersaProbe II is the next generation of PHI's highly successful Multi-Technique Scanning XPS Microprobe, which features a new software user interface for instrument operation and a new 128 channel detector. The VersaProbe II is based on PHI’s scanning x-ray microprobe technology, that provides high performance XPS large area spectroscopy, superior micro-area spectroscopy, chemical imaging, and secondary electron imaging with a raster scanned 10 µm diameter x-ray beam.

    PHI’s innovative and patented dual beam charge neutralization method provides turn-key analysis of insulating samples using a combination of low energy ions and electrons.

    The integral floating column argon ion gun provides an impressive sputter depth profiling capability for inorganic thin film structures. Optional C60+ and Ar2500+ cluster source ion guns provide a unique and powerful organic sputter depth profiling capability.

  • XRD / HIGH RESOLUTION
    SmartLab (XRD)

    The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side.
    The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.
    Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.
    Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.