• LASER CONFOCAL MICROSCOPE / NON-DESTRUCTIVE
    3D Measuring Laser Microscope | LEXT OLS5000

    The OLS5000 3D measuring laser microscope scans laser light over the surface of a sample to provide enlarged images of micro-scale features and to perform shape measurements of surface roughness, steps, and other features.

    The new LEXT OLS5000 microscope is the successor to the OLS4100 microscope and offers significantly improved measurement performance. New 4K scanning technology and enhanced optics designed specifically for the LEXT OLS5000 microscope enable the detection of near-perpendicular features and small steps at close to the nanometer scale. The microscope comes with intuitive software designed for usability with features including the ability to automate settings that previously had to be specified by the operator. Large samples or samples with an uneven surface can be measured thanks to the addition of an expansion frame that can accommodate samples up to 210 mm tall and a long working distance objective lens designed specifically for the OLS5000 microscope. This provides support for sophisticated user requirements from performing observations through data acquisition, analysis and reporting.

    Main Features
    1. Enhanced measurement reliability thanks to 4K scanning technology and optics designed specifically for the OLS5000 microscope
    2. Data acquisition that is four times faster than the previous model and intuitive software
    3. Accommodates samples up to 210 mm tall and concavities up to 25 mm deep using an expansion frame and long working distance objective lens

  • OPTICAL MICROCSOPE / INSPECTION MICROSCOPE / WAFER INSPECTION
    MX (Semiconductor & Flat Panel Display Inspection Microscopes)

    Olympus MX microscopes are developed with the concept to offer the highest efficiency for all our customers. MX microscopes ensure beneficial four levels, Fast start-up, Easy Operation, Failure analysis and expandability for users.

  • OPTICAL MICROCSOPE / INSPECTION MICROSCOPE / WAFER INSPECTION
    AL120 (Semiconductor & Flat Panel Display Inspection Microscopes)

    The AL120 wafer handler series transfers both silicon and compound semiconductor wafers from the cassette to the microscope stage with enhanced capabilities and flexibility, while maintaining an ergonomic design.

  • OPTICAL MICROSCOPE / DIGITAL MICROSCOPE / OPTO-DIGITAL MICROSCOPE
    DXS1000 Digital Microscope

    DSX series digital microscopes combine the quality of our renowned optical technologies with the ease of use of digital technologies. The DSX1000 digital microscope is used to observe and measure a variety of samples, including electronic components and metal materials. The microscope requires little training to use; simply place your sample and easily perform a series of operations from 3D observation to measurement and reporting.

    The DSX1000 microscope meets a wide range of observational and analytical needs in a single unit while improving the inspection workflow. An expanded lineup of 15 lenses covers a 20-7,000X magnification range. Users can also take advantage of the microscope’s six observation methods to observe and measure a variety of objects. For example, techniques are available to highlight irregularities on a sample surface or emphasize contours. The main unit and stage can each be freely adjusted ± 90° to accommodate samples with many shapes and to view the samples from all angles. In addition, newly developed algorithms can be used to acquire 3D images approximately ten times faster than conventional digital microscopes. Lastly, we support efficient and accurate observations and analyses by calibrating microscopes for each user’s operating environment to help ensure accurate measurements.

    Main Features
    1. 20–7,000X magnification range and a rotating stage.
    2. Immediately switch between objective lenses and six observation methods.
    3. Telecentric optical system provides guaranteed measurement accuracy throughout the magnification range

    Available models:
    Entry Model - Easy to use with basic functionality.
    Tilt Model - See sample from many angles
    High-Resolution Model - High-Resolution for advanced analysis
    High-End Model - 6 observation methods and advanced measurement functions

  • OPTICAL MICROSCOPE / HIGH POWER MICROSCOPE
    BX53M Industrial and Materials Science Microscope

    As the successor to the BXiS, the new BX53M/BXFM is the first full model change in 15 years. With the addition of units that facilitate focus adjustment and switching between different observation methods, the new model is designed to be even easier to use. It is also suitable for a wide range of user applications, with a high degree of expandability made possible by the extensive range of units carried over from the previous model. When used in conjunction with the enhanced OLYMPUS Stream software, the BX53M/BXFM provides workflow support from observation through to measurement, analysis, and reporting.


    BX53M/BXFM Main Features:
    1. Designed to be even easier to use, with the addition of units that facilitate aperture adjustment and switching between different observation methods
    2. Suitable for a wide range of applications, with a high degree of expandability made possible by an extensive range of units

  • OPTICAL MICROSCOPE / INVERTED METALLURGICAL MICROSCOPE
    GX (Inverted Metallurgical Microscope)

    Olympus GX series Inverted Metallurgical Microscopes are reliable and high performance imaging system with the advanced Olympus UIS2 optics. GX microscopes ensure the high efficiency by the combination with Olympus Imaging Analysis software.

  • OPTICAL MICROSCOPE / MEASURING MICROSCOPE / METROLOGY
    STM7

    The STM7 microscopes offer excellent versatility and high performance three axis measurements of parts and electrical components, with sub-micron precision. Whether samples are small or large, simple or complex, or measurements are being taken by a novice or an expert, the Olympus STM7 range features measuring microscopes tailored to fit your needs.

  • OPTICAL MICROSCOPE / STEREO MICROSCOPE
    SZX / SZ (Stereo Microscope)

    Olympus SZX/SZ Stereo Microscopes offer clear stereoscopic view with comfortable and ergonomic operation. Extensive types of frames with variety of optical options with wide range of zoom support various applications.

  • REAL-TIME PROBING / NANOPROBE / COMPACT
    Compact Solution Package

    Their mounting interfaces are compatible with standard optical breadboards and microscope stages,allowing you to easily reconfigure your setup for new experiments. Not directly attached to the sample, these stages are ideal for use at low optical working distance. They are also well adapted to contact large substrates mounted on sample holders that are moved by a positioning stage (e.g. wafer chucks, Petri dishes).

  • REAL-TIME PROBING / NANOPROBE / PORTABLE
    Portable Solution Package

    Versatile. 4 manipulators, 1 platform, multiple microscopes.
    Faster experiments. Observe, prepare and characterize your samples at once.
    Hassle-free probe positioning. Instantly adjust the orientation to any sample geometries.
    High mechanical stability. Move without vibration and maintain steady electrical contacts.

  • X-ray Inspection System
    Jade Plus

    Nordson DAGE, the only x-ray company whose focus is on x-ray electronics inspection, offers the Nordson DAGE XD7500VR Jade FP x-ray inspection system that uses the latest technology flat panel detector to provide the market leading, cost effective approach where high quality real time imaging is needed for production tasks. With a great specification, this foundation platform easily outperforms the competition.
    The Nordson DAGE open, transmissive x-ray tube, with its long lifetime filament technology, together with the high quality 1.33 Mpixel CMOS flat panel detector makes this jewel of a system provide the most cost effective choice in terms of price and performance for the high magnification and high resolution real-time imaging necessary for electronics inspection. The vertical system configuration, with the x-ray tube sitting below the isocentric ‘move and tilt’ of the detector, all controlled through the simple, joystick-free, ‘point and click’ software. This provides the safe and collision-free inspection for production applications. All these tasks can be simply and quickly automated without the need for programming skills.

  • X-ray Inspection System
    XD7800NT Ruby XL

    Nordson DAGE, the only x-ray company whose focus is on x-ray electronics inspection, offers the Nordson DAGE XD7600NT Ruby FP x-ray inspection system that uses the latest technology, flat panel detector to provide the first choice for high quality real time imaging in production.
    The unique Nordson DAGE NT maintenance-free, sealed transmissive x-ray tube, providing 0.5 μm feature recognition and up to 10 W of target power, together with the 2 Mpixel long lifetime CMOS flat panel detector makes this jewel of a system the choice for high performance and high magnification real-time imaging. The vertical system configuration, with the x-ray tube sitting below the isocentric ‘move and tilt’ of the detector, all controlled through the simple, joystick-free, ‘point
    and click’ operation of the Nordson DAGE Image Wizard Software provides the safe and collision-free inspection required for production applications. All these tasks can be simply and quickly automated from within the standard Nordson DAGE software without the need for programming
    skills. Optional upgrades include μCT.

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