Crest is excited to participate in IPFA 2025 – the 32nd IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits!
📅 Join us at this premier event where experts in semiconductor reliability, materials characterization, and failure analysis come together to exchange insights and innovations.
🤝 Our team would love to connect! If you’re attending, feel free to reach out and schedule a time for meeting during the event.
Let’s talk about how we can support your lab’s analytical needs.
Crest is excited to participate in IPFA 2025 – the 32nd IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits!
📅 Join us at this premier event where experts in semiconductor reliability, materials characterization, and failure analysis come together to exchange insights and innovations.
🤝 Our team would love to connect! If you’re attending, feel free to reach out and schedule a time for meeting during the event.
Let’s talk about how we can support your lab’s analytical needs.
Join us at this premier event where experts in semiconductor reliability, materials characterization, and failure analysis come together to exchange insights and innovations.
Fourier Transform Infrared Spectroscopy | FTIR
FTIR is a powerful analytical technique used to identify and characterize materials based on their infrared absorption spectra. It provides detailed information about a sample’s molecular composition, chemical bonds, and functional groups — making it essential for quality control, material verification, and failure analysis.
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