32nd IEEE International symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA 2025

Nanoprobing SEM Solution enables precise electrical characterization and manipulation at the nanoscale by integrating nanoprobing tools within a Scanning Electron Microscope, ideal for failure analysis, device testing, and material research.

FTIR is a powerful analytical technique used to identify and characterize materials based on their infrared absorption spectra. It provides detailed information about a sample’s molecular composition, chemical bonds, and functional groups — making it essential for quality control, material verification, and failure analysis.

A Scanning Electron Microscope (SEM) uses focused beams of electrons to produce high-resolution images of a sample’s surface, providing detailed information about its topography, composition, and morphology at the micro- to nanoscale.

X-ray Photoelectron Spectroscopy (XPS) is a surface-sensitive analytical technique that measures elemental composition, chemical states, and electronic structure by detecting electrons emitted from a material when irradiated with X-rays.

Topography & Deformation Measurement involves analyzing surface features and tracking changes in shape or structure under stress, providing critical insights into material behavior, wear, and mechanical performance.

Atomic Force Microscopes (AFM) provide high-resolution 3D surface imaging by scanning a sharp probe over a sample, enabling nanoscale analysis of topography, mechanical properties, and material interactions.