Limited seats available. Please RSVP latest by 12th August
Venue: Makmal i-CRIM, Universiti Kebangsaan Malaysia (UKM)
Date: 14th August 2024
Time: 09:00-12:00pm
14 August 2024
Makmal I-CRIM, University Kebangsaan Malaysia (UKM)
Who should attend?
- Researchers, Material Scientists, Postgraduate Students from physical sciences, polymer engineering, semiconductor and electronics
- Industry Professionals, Engineers in Testing Labs, R&D, Product Development and Failure Analysis interested in studying contamination, thermal analysis, chemical properties etc.
Atomic Force Microscopy (AFM) is a multiparametric imaging technique that characterizes the nanoscale properties of advanced materials. Nanoscale IR spectroscopy identifies and quantifies the chemical composition and structure of materials ranging from biological matter to polymers, 2D materials, and micro-electronics. Combining these techniques in Photothermal AFM-IR spectroscopy enables multimodal analysis and correlation of nanoscale topographical, mechanical, electrical, and chemical properties, allowing the rapid, non-destructive, and comprehensive investigation of material properties.
In this free workshop, the speaker will review the fundamentals of the photothermal AFM-IR technique and walk through the participants the AFM-IR workflow with diverse examples in polymer, semiconductor devices and other physical sciences.
Speakers
Dr. Yun Chen works as an Application Scientist at Bruker, focusing on exploring application and providing technical support of surface metrology and tribology instruments. He was academically trained in biomedical engineering, biotechnology and physical chemistry. His PhD work in University of Groningen, Netherlands focused on investigating bacterial behaviors on various biomaterial surfaces. Before joining Bruker, Yun pursued his academic career in Leeds University, UK, working on resolving molecular interactions and kinetics involved in the initial stage of amyloid formation.
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