ISPAC 2025
Venue: Nanyang Technological University, Singapore
Date: 23 to 27 June 2025
Crest is proud to showcase a suite of advanced solutions that empower deeper insight into polymer structure, composition, and behavior, including:
🔬 X-Ray Diffraction (XRD)
🔬 Wavelength Dispersive X-Ray Fluorescence (WDXRF)
🔬 Single Crystal Diffraction
🔥 Thermal Analysis (TA) systems
We look forward to engaging with fellow researchers, academics, and industry professionals driving innovation in polymer science.
🤝 Schedule a Meeting with Us!
Let’s connect and discuss how our cutting-edge solutions can help you achieve your business goals. Contact us now to book a meeting during the event and learn how we can transform your processes with precision, innovation, and reliability.
Crest is proud to present its latest advancements in precision technology at 36th International Symposium for Polymer Analysis and Characterisation. With a strong commitment to driving efficiency and innovation.
X-Ray Fluorescence (XRF) – WDXRF & TXRF Solutions
Unlock high-precision elemental analysis with Wavelength Dispersive X-ray Fluorescence (WDXRF) and Total Reflection X-ray Fluorescence (TXRF) technologies. These techniques provide non-destructive, reliable, and quantitative measurements for a wide range of materials — from solids and powders to liquids and thin films.
Thermal Analysis Systems | TA
Understand how materials behave under heat with Thermal Analysis (TA) systems — essential tools for characterizing polymers, composites, pharmaceuticals, and advanced materials.
Single Crystal X-Ray Diffractometer
The Single Crystal X-Ray Diffractometer (SC-XRD) is the gold standard for determining precise crystal structures at the atomic level.
Single Crystal X-Ray Diffractometer
Single Crystal Diffraction provides precise 3D atomic structure determination of crystalline materials.
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