BRUKER DEKTAK PRO
Online Webinar With Sample Demo

See how to use stylus profilometry to improve semiconductor device performance & processes

Venue: Online Webinar
Date: 22 July 2025
Time: 3PM - 4PM (Malaysia Time)

This online webinar will discuss and demonstrate how Dektak stylus profilers deliver precise, repeatable surface measurements critical to semiconductor device performance and process control.

Participants can expect to:

  • Learn how experts use stylus profilers and the practical considerations for using stylus profilometry techniques in their research;
  • Understand how to choose an appropriate technique for thickness measurements of electronics devices; and
  • See how effective stylus profilers are and how to ensure measurements are accurate.

This online workshop will give an overview of Contact Stylus Profilometry fundamental principles, its applications and demo with Bruker Dektak Pro.

Crest is proud to showcase a suite of advanced solutions that empower deeper insight into polymer structure, composition, and behavior, including:
Bruker Dektak Pro

Date Icon22 July 2025
Location IconOnline Webinar

 

We look forward to engaging with industry professionals driving innovation in semiconductor manufacturing process.

 

Providing Ultimate Versatility and Ease of Use

1) Accurate and responsive in dynamic measurement scenarios

 

 

With Dektak Pro, one measurement head covers 5 nm–1 mm step heights and 0.03–15 mg loads (with N-Lite+ option) without recalibration. The low-inertia sensor (LIS 3) rapidly adapts to sudden changes in surface topography and maintains accuracy and responsiveness in dynamic measurement scenarios

 

2) Suited to widely diverse applications

 

dektak pro

 

Dektak Pro addresses R&D, process development, and QA/QC present and future needs across a host of industrial and research applications, such as: 

  • Microelectronics
  • Thick film coatings
  • Biomaterials

 

3) Fast and easy stylus replacement

 

easy stylus replacement

 

Dektak Pro’s unique self-aligning stylus assembly facilitates quick and easy stylus exchange while eliminating any potential mishaps during the process. Bruker offers the widest range of stylus sizes to accommodate nearly any application requirement.

 

Bruker Dektak Pro is a high-performance stylus profilometer designed for precision surface metrology across semiconductor, thin/thick film coating, and biomaterial applications. With industry-leading resolution and repeatability—delivering step height measurements down to the single-nanometer scale—it ensures unmatched accuracy for R&D, process control, and QA/QC.

 

Key features include:

  • Sub-angstrom repeatability and low noise floor for ultra-precise measurements
  • High-throughput scanning with direct-drive stage and 64-bit Vision64® processing
  • Automated step height algorithms for consistent and error-free analysis
  • Wide application flexibility with fast, self-aligning stylus exchange and diverse stylus options
  • Live optical imaging enhancements for easier feature targeting

Ideal for industries demanding reliable profiling of microelectronic surfaces, film thicknesses, and biomaterial structures.

 

Schedule a Meeting with Us!
Let’s connect and discuss how our cutting-edge solutions can help you achieve your business goals. Contact us now to book a meeting during the event and learn how we can transform your processes with precision, innovation, and reliability.

 

 

Crest is proud to present its latest advancements in precision technology at Bruker Dektak Pro - Online Webinar. With a strong commitment to driving efficiency and innovation. 

Dektak Pro

Dektak Pro

Bruker’s 11th-generation Dektak Pro is a high-precision benchtop stylus profilometer delivering unmatched accuracy—with single-nanometer step-height capability and better than 4 Å repeatability—plus rapid, automated scanning and analysis, versatile stylus options, and optimized performance for semiconductors, film coatings, and biomaterials.

Speakers

Bruker Nano Surfaces Metrology
Dr Chen Yun
Application Scientist
Bruker Nano Surfaces Metrology

Dr. Yun Chen works as an Application Scientist at Bruker, focusing on exploring application and providing technical support of surface metrology and tribology instruments. He was academically trained in biomedical engineering, biotechnology and physical chemistry. His PhD work in University of Groningen, Netherlands focused on investigating bacterial behaviors on various biomaterial surfaces. Before joining Bruker, Yun pursued his academic career in Leeds University, UK, working on resolving molecular interactions and kinetics involved in the initial stage of amyloid formation. 
 

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