Overview of Stylus Profiling Metrology and its Applications
Tuesday, 29 Oct | 2pm
Many processes in semiconductors, optical coatings, and micro-electromechanical systems (MEMS), as well as research in flexible electronics and sensors, depend on accurate thickness and etch-depth measurements. Among their various metrology capabilities, stylus profilers excel at delivering exceptional step height measurements at both the nanoscale and microscale.
In this webinar, we will explore how stylus profilers can characterize a diverse range of materials, particularly in microelectronics and semiconductor applications. Additionally, we will introduce Bruker’s new 11th generation Dektak Pro Stylus Profiler, providing even more enhanced operability, reliability, and measurement accuracy to enhance and extend the qualities that make Dektak synonymous with stylus profiling.
Webinar Speakers
Mr. Lau Wee Chee
Senior Product Specialist, Bruker Nano Surfaces and Metrology
Products
Dektak Pro Stylus Profiler
Delivers accurate, precise data with the highest resolution, lowest noise floor, and easiest tip exchange of any commercially available stylus profilometer.