AMI D9650 C-SAM Inspection System
Product Overview
A state-of-the-art instrument designed to deliver unparalleled performance and versatility for nanoscale researchers across scientific and industrial domains. Building upon decades of innovation and user feedback, the Dimension Icon® offers exceptional resolution, low noise, and application flexibility, making it the premier choice for large-sample AFM applications. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.
Key Features
- Unmatched Performance: Utilizes Bruker's proprietary tip-scanning technology with temperature-compensating position sensors, achieving sub-angstrom noise levels in the Z-axis and angstrom-level precision in XY axes.
- Advanced Imaging Capabilities: Incorporates PeakForce Tapping® technology, enabling high-resolution imaging with minimal sample damage.
- User-Friendly Operation: Features an intuitive graphical user interface and preconfigured software settings, facilitating quick setup and immediate acquisition of publication-quality data.
- Versatile Platform: Supports a wide range of applications with an open-access design, accommodating various sample sizes and types.
Specifications
| Specification | Details |
|---|---|
| Scan Range | 90 μm x 90 μm x 10 μm |
| Noise Level | Sub-angstrom in Z-axis; angstroms in XY axes |
| Imaging Modes | PeakForce Tapping®, Contact Mode, Tapping Mode, and more |
| Controller | NanoScope® 6 with high-speed, low-noise architecture |
| Sample Accommodation | Supports large or multiple samples with versatile sample holders |
| Software Interface | Intuitive GUI with preconfigured settings for various applications |
| Additional Features | Open-access platform for customization; compatibility with a wide range of hardware and software extensions |
Applications
- Materials Science: Characterization of surface roughness, mechanical properties, and nanostructures.
- Semiconductor Research: Analysis of thin films, dopant distributions, and failure analysis.
- Polymers and Composites: Investigation of phase separation, crystallinity, and viscoelastic properties.
- Life Sciences: Imaging of biomolecules, cells, and tissue samples at nanoscale resolution.
Resources
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