High-Throughput Plasma FIB-SEM for Advanced Life Sciences Research

Tescan Amber X SEM

Product Overview

The TESCAN AMBER X LS is a state-of-the-art plasma-focused ion beam scanning electron microscope (FIB-SEM) tailored for life sciences applications. Featuring the advanced iFIB+ column, it enables rapid material removal and sample thinning, significantly enhancing throughput for cryo-electron tomography (cryo-ET) sample preparation. This system excels in handling both soft and hard biological specimens, including tissues, bones, and shells, making it indispensable for core facilities and imaging centers.

 

Key Features

  • Ultra-Fast Cryo-ET Sample Preparation: The iFIB+ plasma FIB column accelerates material removal and sample thinning, addressing major bottlenecks in cryo-ET workflows.
  • Efficient Cryo On-Grid Lamella Preparation: High-performance plasma FIB and optimized workflows enable rapid on-grid lamella preparation, essential for high-throughput cryo-EM sample processing.
  • Intuitive Cryo Lift-Out: The TESCAN cryo-nanomanipulator facilitates easy cryo lift-out with precise movement and intuitive probe tip navigation.
  • Versatile Sample Processing: Capable of handling soft and hard specimens, as well as those with mixed compositions, without introducing curtaining artifacts, thanks to TESCAN’s True X-Sectioning kit and Rocking Stage.
  • Enhanced Cryo-Microscopy Productivity: Seamless integration with Leica Microsystems GmbH and Quorum Technologies Ltd cryo systems ensures convenient and safe microscope operation under cryogenic conditions.
  • Safe Navigation: A unique 3D chamber model provides collision protection, allowing quick and safe navigation to regions of interest.
  • User-Friendly Software: TESCAN Essence™ software offers ready-to-use, guided, and customizable workflow templates, enabling new users to become productive quickly while allowing experts to customize microscope controls.

 

Specifications

Feature Specification
Ion Source Xenon Plasma FIB (iFIB+ column)
Electron Source High-Brightness Schottky Field Emission Gun (FEG)
Imaging Resolution High-resolution SEM imaging capabilities
Cryo Compatibility Supports cryo-FIB and cryo-SEM workflows
Sample Handling Accommodates soft and hard biological specimens, including mixed compositions
Software TESCAN Essence™ with guided and customizable workflow templates
Integrated Cryo Systems Compatible with Leica Microsystems GmbH and Quorum Technologies Ltd cryo systems for seamless operation
Artifact Prevention TESCAN’s proprietary methods to prevent curtaining artifacts during milling
Navigation 3D chamber model for collision protection and efficient navigation
Field of View Exceptional FIB field of view covering up to 1 mm for cross-sectioning and large-volume analyses

 

Applications

  • Cryo-Electron Tomography (Cryo-ET): Rapid and precise preparation of on-grid lamellae from plunge-frozen specimens, enhancing the efficiency of cryo-ET workflows.
  • 3D FIB-SEM Tomography: High-resolution 3D reconstruction of large volumes, suitable for hard biological materials such as bones and shells.
  • Biomedical Research: Detailed structural analysis of tissues and cells, facilitating studies in various biomedical fields.
  • Materials Science: Versatile capabilities make it suitable for analyzing a variety of materials and specimens, both at ambient and cryogenic temperatures.

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