Clara Scanning Electron Microscope

Product Overview

The CLARA is a field-free ultra-high-resolution (UHR) scanning electron microscope (SEM) designed for nanoscale materials characterization. Featuring the BrightBeam™ electron column, MultiVac variable pressure mode, and advanced detection technology, the CLARA delivers exceptional imaging performance at low beam energies, ensuring maximum sample integrity and topographic detail.

With intelligent signal collection, ultra-high spatial resolution, and advanced material contrast detection, the CLARA SEM is ideal for nanomaterial research, metallurgy, semiconductor inspection, life sciences, and geological studies.

Key Features

• BrightBeam™ Electron Column – Field-free UHR SEM imaging at low landing voltages for maximum topography clarity.
• MultiVac Variable Pressure Mode –Supports low vacuum imaging for non-conductive and beam-sensitive samples.
• Selective Signal Collection – Simultaneous collection of secondary (SE) and backscattered (BSE) electron signals.
• Advanced In-Column BSE Detection – Angular and energy-filtering for enhanced material contrast and surface detail.
• Optical Navigation & Correlation Camera (ONCam) – True-color navigation for easy sample positioning and SEM correlation.
• Ultra-Wide Field of View (Wide Field Optics™) – Fast switching between high- and low-magnification imaging.
• EquiPower™ Lens Technology – Optimized for stable imaging and analytical performance at all beam currents.
• Essence™ Software Platform – User-friendly, modular interface with advanced imaging and analysis tools.
• Beam Deceleration Technology (Optional) – Enhances resolution by reducing sample charging artifacts.

Specifications

Applications

• Characterization of nanoparticles, nanotubes, and agglomerates – Ultra-high resolution imaging of nanoscale structures.
• Powder & Thin Film Analysis – Examine grain morphology, composition, and particle distribution.
• Carbon & Ceramic-Based Nanomaterials – Capture fine surface details without charging artifacts.
• Microstructure & Phase Analysis – High-contrast imaging of steel, alloys, and composite materials.
• Failure Analysis & Quality Control – Detect defects, porosity, and contamination in manufactured parts.
• EDS & EBSD Analysis – Perform elemental mapping and crystallographic studies with high spatial resolution.
• Wafer & IC Chip Inspection – Assess surface defects, layer integrity, and contamination at the nanoscale.
• PCB & Solder Joint Analysis – Identify soldering defects, microcracks, and conductive pathways.
• Thin Film Deposition Studies – Investigate coating uniformity and adhesion properties.
• Biological Sample Analysis – Study bacteria, blood cells, and fungal spores in high detail.
• Cryo-SEM for Soft Materials – Maintain sample integrity while imaging hydrated and beam-sensitive structures.
• Tissue & Bio-Material Studies – High-resolution imaging of cell structures and biomaterial coatings.
• Mineral & Rock Sample Analysis – Study microstructures, composition, and phase distribution.
• Petrographic & Pore Structure Imaging – Evaluate porosity and fluid pathways in sedimentary rocks.
• Cathodoluminescence & EDX Mapping – Identify mineral compositions and structural defects.