Advanced Automated AFM Metrology System
Product Overview
The Dimension FastScan AFM by Bruker is engineered to deliver high-speed scanning without compromising resolution, force control, or system performance. Capable of capturing images at rates exceeding 125 Hz and producing frames in as little as one second, it enables real-time visualization of nanoscale dynamics in both air and fluid environments. This system is ideal for researchers requiring rapid, high-resolution imaging across various sample sizes.
Key Features
- High-Speed Performance: Achieves scan rates over 125 Hz, allowing for rapid data acquisition without sacrificing image quality.
- Real-Time Nanoscale Dynamics: Provides ultimate tip-scanning speed and stability for direct observation of dynamic behaviors at the nanoscale.
- Automated Operation: Features automated setup, data acquisition, and analysis, simplifying operation and enhancing productivity.
- PeakForce Tapping® Technology: Enables instantaneous force measurement with a linear control loop, allowing for precise mechanical property mapping.
- Exceptional Productivity: Capable of unattended, automated imaging of multiple samples within minutes, yielding publication-quality results.
Specifications
| Specification | Details |
|---|---|
| Scan Rate |
125 Hz |
| Image Acquisition Time | As fast as 1 second per frame |
| Vertical Noise | <30 pm with Icon scanner; <40 pm with FastScan scanner |
| Drift Rate | <200 pm per minute over extended periods |
| Imaging Modes | Contact Mode, Tapping Mode, PeakForce Tapping®, among others |
| Sample Compatibility | Suitable for various sample sizes and types |
| Environment | Operates in air or fluid |
Applications
- Materials Science: High-resolution imaging of polymers, composites, and nanomaterials to study surface structures and mechanical properties.
- Semiconductor Research: Characterization of surface topography and defects in semiconductor devices.
- Nanotechnology: Investigation of nanostructures and nanodevices for various applications.
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