Precision, Performance, and Versatility at the Nanoscale
Product Overview
The Dimension Icon® AFM is large-sample atomic force microscope system, setting a new standard for high-resolution imaging, low noise, and exceptional versatility. Engineered with state-of-the-art closed-loop tip-scanning technology, it provides artifact-free imaging, unmatched measurement accuracy, and fast time-to-results, making it the most powerful and widely adopted AFM in research and industry.
Whether you're pushing boundaries in materials science, semiconductors, or bioimaging, the Dimension Icon gives you the resolution, repeatability, and ease of use to drive discovery.
Key Features
- Ultra-Low Noise & Drift: Closed-loop scanner with <30 pm RMS vertical noise floor and <200 pm drift—ideal for high-precision metrology.
- High-Speed, High-Resolution Imaging: Advanced scanning algorithms enable fast data acquisition without sacrificing resolution.
- PeakForce Tapping® & ScanAsyst® Technology: Automated force control and image optimization ensure consistent, high-quality results across users.
- Most Flexible AFM Platform: Open-access design supports over 30 AFM modes and full signal line access for custom configurations.
- Industry-Leading Control System: NanoScope 6 controller enables simultaneous multi-channel imaging up to 5120x5120 resolution.
Specifications
| Specification | Details |
|---|---|
| X-Y Scan Range | 90 µm × 90 µm typical |
| Z Range | 10 µm typical (9.5 µm minimum) |
| Vertical Noise Floor | <30 pm RMS (typical) |
| X-Y Noise (Closed/Open Loop) | ≤0.15 nm RMS / ≤0.10 nm RMS |
| Z Sensor Noise | 35 pm RMS (imaging), 50 pm RMS (force curve) |
| Integral Nonlinearity (X-Y-Z) | <0.5% typical |
| Sample Size Capacity | ≤210 mm diameter, ≤15 mm thickness |
| Motorized Stage (X-Y Axis) | 180 mm × 150 mm area; ±2–3 µm repeatability |
| Microscope Optics | 5 MP camera, 180–1465 µm field of view, motorized focus |
| Controller | NanoScope 6 |
| Standard Imaging Modes | Tapping, PeakForce, Contact, LFM, Phase, MFM, etc. |
| Optional Modes | Nanoindentation, AFM-nDMA, SCM, TUNA, TR-TUNA, etc. |
| Acoustic Tolerance | Up to 85 dBC operating environment |
| Certification | CE and UKCA |
Applications
Materials Science
- Topography and nanomechanical mapping of polymers, composites, ceramics
- Crystallization kinetics and phase analysis
Semiconductor & Electronics
- Failure analysis, surface potential, and trench measurements
- Capacitance, spreading resistance, and tunneling AFM modes
Energy & Battery Research
- In situ characterization of lithium-ion battery materials
- Local electrochemical analysis with PeakForce SECM and conductivity mapping
Resources
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