High-Performance Atomic Force Microscopy with Co-Localized µ-Raman Capability
Product Overview
The Dimension Icon-Raman system combines the world’s leading large-sample Atomic Force Microscope (AFM) with high-end confocal Raman spectroscopy. This co-localized platform enables researchers to simultaneously measure mechanical, electrical, and chemical properties on the same nanoscale region—redefining high-performance, multi-modal surface characterization.
Whether you’re investigating polymer blends, composite materials, or 2D nanomaterials, the Dimension Icon-Raman enables seamless correlation between topographical features and chemical compositions for deeper material understanding.
Key Features
- True Co-Localized Imaging: Collect topography, nanomechanical properties, and chemical data from the exact same area using MIRO® overlay software.
- Advanced Confocal µ-Raman Spectroscopy: Integrates with leading Raman systems (e.g., Horiba LabRAM, Renishaw inVia) with full wavelength mapping and spot analysis capabilities.
- PeakForce QNM® & PeakForce TUNA: Proprietary Bruker modes for nanoscale mechanical and electrical characterization.
- ScanAsyst® Technology: Enables automatic optimization of scan parameters, ensuring consistent and high-quality imaging—even by novice users.
- Flexible Configuration: System sits on a single, rigid, anti-vibration platform, allowing independent and combined AFM-Raman use with minimal adjustment.
- Sub-Micron Correlation Accuracy: Precision XY stage enables <3 µm positioning for co-located AFM and Raman measurements.
Specifications
| Specification | Details |
|---|---|
| AFM Platform | Bruker Dimension Icon |
| Raman Integration | Compatible with Horiba, Renishaw, Bruker Optics systems |
| Co-Localization Accuracy | <3 µm, with perfect overlay using MIRO software |
| Supported Raman Features | Multiple excitation wavelengths, mapping, spot analysis |
| Overlay Capability | Full image stack alignment: topography, modulus, Raman map |
| Imaging Modes | PeakForce QNM®, TUNA™, KPFM, ScanAsyst®, and more |
| Sample Transfer | Seamless AFM ↔ Raman switching in seconds via precision stage |
| Platform Configuration | Single rigid, anti-vibration setup |
| Software | NanoScope & MIRO® overlay |
Applications
Semiconductors & Electronics
- Nanomechanical and chemical mapping of composites, coatings, and polymers
- Phase identification and distribution in blends
Semiconductors & Electronics
- Layered material characterization (e.g., silicon, graphene)
- Identification of structural and compositional variations impacting performance
Energy Storage & Conversion
- In situ battery material studies
- Electromechanical property correlation in fuel cells and supercapacitors
Resources
Download Dimension Icon-Raman Brochures
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