Nanoscale Infrared Spectroscopy and Property Mapping
Product Overview
The Dimension IconIR is a groundbreaking large-sample nanoscale infrared (nanoIR) spectroscopy system, combining infrared imaging, AFM-based property mapping, and correlated electrical and mechanical characterization. Designed to push the boundaries of chemical, thermal, and structural analysis at the nanoscale, IconIR offers monolayer sensitivity and sub-10 nm spatial resolution.
Leveraging Bruker’s renowned PeakForce Tapping® and AFM-IR technologies, this system is uniquely capable of delivering correlated nanochemical, nanoelectrical, and nanomechanical imaging and spectroscopy — all from a single platform. It’s ideal for researchers in semiconductors, polymers, biomaterials, and 2D materials, where high-resolution chemical imaging and in-situ property correlation are essential.
Key Features
- High-performance resonance-enhanced AFM-IR with FT-IR correlation
- <10 nm chemical spatial resolution with monolayer detection sensitivity
- Correlated property mapping using PeakForce QNM®, KPFM™, and sMIM
- Supports a wide range of nanoIR modes: Tapping AFM-IR, Contact AFM-IR, FASTmapping
- Large-sample support (up to 150 mm) with fully motorized XY stage
- Compatible with fluids, vacuum, and purged environments
- Integrated optics with 5 MP camera, digital zoom, and motorized focus
- Acoustic and vibration isolation support for high-performance environments
Specifications
| Specification | Details |
|---|---|
| nanoIR Modes | Resonance-enhanced AFM-IR, Tapping AFM-IR, Contact AFM-IR |
| XY Scan Range | 90 × 90 μm (typical), 85 μm min |
| Z Range | 10 μm (typical), 9.5 μm minimum |
| AFM Vertical Noise Floor | ≤50 pm RMS |
| Sample Size Compatibility | Up to 150 mm diameter, <15 mm thick |
| Motorized XY Stage Travel | 150 × 150 mm |
| Microscope Optics | 5 MP digital camera, 180–1465 μm FOV, digital zoom |
| Nanomechanical Modes (optional) | PeakForce QNM®, AFM-nDMA, FASTForce Volume™, RampScript™ |
| Nanoelectrical Modes (optional) | PeakForce TUNA™, sMIM™, KPFM™, CAFM, SSRM, DCUBE variants |
| Environmental Controls | Acoustic hood, purge hood, fluid imaging support |
| Other Capabilities | AutoMET®, Fast Tapping |
Applications
Semiconductors & Electronics
- Nanoscale chemical imaging of device layers and failure sites
- AFM-IR on thin films, gate oxides, and interconnects
- Dielectric mapping and electrical property correlation
2D Materials & Nanomaterials
- Monolayer detection and vibrational analysis
- In-situ nanochemical and nanoelectrical characterization
- Spectral mapping of graphene, MoS₂, and other 2D layers
Academic Research & R&D
- Multi-modal nanoscale studies in energy, catalysis, and more
- FT-IR correlated nanoIR spectroscopy for materials discovery
- Publication-ready imaging and spectral data across disciplines
Resources
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