High-Performance Atomic Force Microscope
Product Overview
The Dimension Nexus AFM delivers an optimal blend of data quality, experimental flexibility, and user-friendly operation within a compact footprint. Incorporating NanoScope® 6 controller, PeakForce Tapping® technology, and ScanAsyst® Plus self-optimizing imaging software, the Nexus AFM offers superior functionality compared to other systems in its class. Its design accommodates both routine and customized experiments, making it a valuable asset for research and industrial applications. Additionally, the system is field-upgradable, ensuring adaptability to evolving research needs.
Key Features
- High-Resolution Imaging: Achieves atomic- to molecular-level resolution for detailed surface characterization.
- Versatile AFM Modes: Supports a comprehensive range of modes, including the full suite of PeakForce Tapping® techniques for quantitative mechanical, electrical, and chemical property mapping.
- Programmable Motorized Stage: Facilitates high-throughput, multi-site measurements with a 150 mm x 150 mm inspectable area, enhancing productivity.
- User-Friendly Operation: Features streamlined sample and probe setup, along with ScanAsyst® Plus self-optimizing imaging for consistent, reliable results.
- Stable and Accurate Scanning: Equipped with an XYZ closed-loop scanner, drift-compensated bridge structure, and integrated granite base to ensure minimal drift and high accuracy during extended scans.
- Extensive Upgrade Options: Offers a variety of enhancements, including unique operating modes, environmental controls, and software integrations to accommodate expanding research requirements.
- Open-Access Design: Provides physical access to the probe-sample junction, allowing for the attachment of electrical connections and custom accessories.
- Advanced Data Analysis: Utilizes the NanoScope 6 controller's open hardware and software platform, featuring front-panel BNC connectors and scripting software options for customized analyses.
Specifications
| Parameter | Specification |
|---|---|
| XY Scan Range | 90 μm x 90 μm (typical), 85 μm (minimum) |
| Z Range | 10 μm (typical) in imaging and force curve modes, 9.5 μm (minimum) |
| Sample Size/Holder | Accommodates samples up to 150 mm in diameter and 15 mm in thickness, secured via a 150 mm vacuum chuck |
| Motorized XY Stage Travel | 150 mm x 150 mm inspectable area with 6 μm bidirectional repeatability; programmable for multi-site measurements |
| Microscope Optics | 5 MP digital camera with viewing areas ranging from 180 μm to 1465 μm; includes digital zoom and motorized focus capabilities |
| Certification | CE compliant |
| System Footprint (W x L) | 24" x 32" (excluding customer desk/workstation) |
| Controller | NanoScope 6 |
| Automated Metrology Recipes | Not available |
| Sample Flexibility | Tip Scanner |
| Small & Multi-Sample Compatibility | Yes |
Applications
Semiconductor Industry
- Surface Roughness Quantification: Measure nanoscale surface roughness of semiconductor thin films and substrates to ensure quality and performance.
Energy Research
- Photovoltaic Material Analysis: Correlate structural and ferroelectric properties of perovskites to optimize photovoltaic device efficiency.
- Battery Component Studies: Conduct in-situ and operando investigations of local electrochemical activity in lithium-ion battery materials.
Nanotechnology
- Device Characterization: Integrate with microprobers for electrical characterization of nanoscale devices, facilitating the development of advanced nanotechnologies.
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