Extreme Research Systems for Nanomechanics, Nanoelectrical, and Nanoelectrochemical Analysis
Product Overview
The Dimension XR is a family of advanced Scanning Probe Microscopes (SPMs) tailored for groundbreaking research in nanomechanics, nanoelectrical, and nanoelectrochemical characterization. Built on the proven FastScan® and Dimension Icon® platforms, Dimension XR systems bring together three decades of innovation in atomic force microscopy (AFM) to deliver unmatched performance, versatility, and ease of use for nanoscale research.
With specialized configurations—XR Nanomechanics, XR Nanoelectrical, and XR NanoEC (Electrochemical)—Dimension XR enables high-resolution, quantitative analysis in air, liquid, or reactive environments. It supports a wide range of materials, from soft hydrogels to stiff ceramics, and delivers multi-dimensional data that correlates mechanical, electrical, and electrochemical properties at the nanoscale.
Key Features
- Three Configurations:
- XR Nanomechanics: AFM-nDMA™, PeakForce QNM®, FASTForce Volume, and Contact Resonance
- XR Nanoelectrical: DataCube Modes, PeakForce TUNA™, KPFM, SSRM, sMIM
- XR NanoEC: PeakForce SECM™, EC-AFM, high-resolution electrochemical imaging
- Ultimate Resolution & Reproducibility: Sub-100 nm electrochemical resolution, atomic-scale topography, and reproducible data across environments
- Multi-Mode Imaging: Correlate topography, mechanical, electrical, and chemical properties in one scan
- High-Speed and High-Throughput: Fast scanning with auto-alignment and smart engaging for unattended workflows
- Scalable and Flexible: Modular architecture supports upgrades and integration of additional modes or custom setups
Specifications
| Feature | Specification |
|---|---|
| Scan Platform Options | FastScan® or Dimension Icon® |
| X-Y Scan Range | ≥90 x 90 μm (Icon) / ≥35 x 35 μm (FastScan) |
| Z Range | ≥12 μm (Icon) / ≥3 μm (FastScan) |
| Vertical Noise Floor (RMS/Adev) | ≤30/25 pm (Icon) / ≤40/32 pm (FastScan) |
| System Drift | <200 pm/min |
| Sample Size | Up to 210 mm diameter, 15 mm thick |
| Positioning | 150 × 180 mm inspectable area with motorized stage |
| Optics | Autofocus, digital zoom, <1 μm resolution |
| Certifications | CE and UKCA Certified |
Applications
Semiconductor and Electronics
- Dielectric breakdown and leakage current mapping
- Work function and carrier density profiling
- Advanced failure analysis and materials development
Energy and Electrochemistry
- Real-time in-situ electrochemical reactions
- Corrosion analysis, battery interfaces, and fuel cells
- SECM mapping of catalysts and bioelectrochemical materials
Materials Science and Engineering
- Quantification of mechanical properties across material types
- High-throughput multi-sample analysis
- Structure-property correlation on hybrid and smart materials
Nanotechnology and Research Institutions
- Sub-molecular imaging and structure resolution
- Combined electrical, chemical, and mechanical property mapping
- Customizable workflows for cutting-edge research
Resources
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