Precision Nanoindentation Platform for Core Mechanical and Tribological Testing
Product Overview
The Hysitron® TS 77 Select™ is an automated benchtop nanomechanical and nanotribological test system designed for quantitative characterization from the nanoscale to microscale. Built on Bruker’s trusted TriboScope® capacitive transducer platform, the TS 77 Select delivers reliable, high-resolution measurements of hardness, modulus, viscoelasticity, wear, adhesion, and surface topography.
The system supports a suite of essential testing modes—nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and in-situ scanning probe microscopy (SPM)—all controlled via an intuitive software interface. It’s designed for ease of use, robust data reproducibility, and adaptability across a wide range of materials, making it ideal for both routine QA and cutting-edge R&D.
Key Features
- Electrostatic actuation and capacitive displacement sensing for low thermal drift and high sensitivity
- Integrated in-situ SPM imaging ensures nanometer-accurate test placement
- High-speed property mapping up to 180x faster than conventional nanoindentation
- Supports nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and mechanical mapping
- Modular hardware with granite frame, anti-vibration, and environmental enclosure for stability
- TS Select control software with automated testing, ISO 14577 and ASTM E2546 compliance
- Pre-loaded testing routines and auto-calibration for consistent results
- Sample chuck options for rapid and rigid sample mounting across multiple sample types
Specifications
| Specification | Details |
|---|---|
| Force Resolution | Nano-Newton range |
| Displacement Resolution | Sub-nanometer |
| Max Load Capacity | Up to 10 mN |
| Measurement Modes | Nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, SPM |
| SPM Imaging | Topography mapping with test probe, nanometer-precision test placement |
| High-Speed Mapping | Up to 2 tests per second (180x faster than standard) |
| Dynamic Nanoindentation | Frequency-dependent modulus and viscoelasticity depth profiling |
| Nanoscratch | Friction, mar resistance, and thin film adhesion testing |
| Control Software | TS Select software with TriboScan and Tribo iQ analysis packages |
| Stage and Sample Support | Universal chuck, multi-sample stage, mechanical rigidity with granite base |
| Environmental Control | Acoustic, thermal, and vibration isolation enclosure |
| Calibration | Fully automated with standards-compliant routines |
| Standard Compliance | ISO 14577, ASTM E2546 |
Applications
Semiconductors & Electronics
- Thin film mechanical property testing on dielectrics and coatings
- Adhesion strength and wear of advanced packaging materials
- On-die mapping for reliability studies
Semiconductors & Electronics
- Thin film mechanical property testing on dielectrics and coatings
- Adhesion strength and wear of advanced packaging materials
- On-die mapping for reliability studies
Energy Storage & Conversion
- Mechanical behavior of battery interfaces, electrolytes, and coatings
- Quantitative wear analysis for fuel cells and capacitive materials
Coatings & Tribology
- Evaluation of ultra-thin hard coatings for wear resistance
- Scratch testing for mar resistance and layer delamination detection
Resources
Please complete the form and we will be in contact as soon as possible.