Superior AFM Research Performance and Versatility
Product Overview
The Innova AFM is a high-performance atomic force microscope designed to deliver exceptional imaging resolution and research flexibility across a broad range of materials and sample types. Known for its closed-loop scan accuracy, low noise, and real-time control, Innova provides atomic-resolution results with minimal drift—making it a perfect choice for both routine high-resolution imaging and advanced SPM studies.
From polymers to semiconductors and biological molecules, Innova enables precise nanoscale characterization with powerful software, fast setup, and full access to a wide range of AFM modes. Whether used in academic labs or advanced industrial research, Innova brings together reliability, customization, and performance in one elegant solution.
Key Features
- High-Resolution Imaging: Delivers atomic-resolution imaging with <50 pm Z noise and minimal drift (<1 nm/min)
- Closed-Loop Accuracy: Linearized scanning across full 90 µm range without scanner changes
- Fast Experiment Setup: Ergonomic open-stage design, high-NA top-down optics with sub-micron resolution
- NanoDrive Software: Intuitive interface with real-time control, preconfigured experiments, and powerful data analysis
- Advanced Mode Support: Includes KPFM, SCM, EFM, MFM, CAFM, STM, PFM, TERS-enabled IRIS integration
- Customizable and Open Design: Easy tip/sample access and modular architecture for optical and electrical experiments
- Versatile Sample Compatibility: Ideal for physical sciences, materials science, electronics, life sciences, and nanotechnology research
Specifications
| Feature | Specification |
|---|---|
| XY Scan Range (Closed-Loop) | >90 µm |
| Z Range (Closed-Loop) | >7.5 µm |
| Z Noise Floor | <50 pm RMS |
| XY Noise (Closed-Loop) | <1.2 nm RMS |
| XY Drift (Closed-Loop) | <3 nm/min |
| Sample Size | Up to 45 mm x 45 mm x 18 mm |
| Motorized Z Travel | 18 mm with tilt/pitch control |
| Optics | On-axis, <2 µm resolution (0.75 µm with 50x objective) |
| Software | NanoDrive™ (control) + NanoScope® Analysis |
| Electronics | 20-bit DAC, 8 ADCs, dual digital lock-ins, external signal access |
| AFM Modes | Contact, Tapping, Phase, Lift, KPFM, MFM, EFM, CAFM, STM, SCM, PFM, etc. |
| System Size | Microscope: 14"x14"x10"; Controller: 23"x13.5"x21" |
| Certifications | CE and UKCA compliant |
Applications
Semiconductors & Electronics
- Doping profile visualization with SCM and KPFM
- Conductivity mapping with CAFM
- Nanoscale defect and failure analysis
Energy & Photovoltaics
- ECSPM for battery and solar cell research
- Surface potential mapping under different charge states
- Electrochemical reactions and thin film analysis
Nanotechnology & Research Labs
- Atomic-scale resolution of self-assembled nanostructures
- Tip-enhanced Raman Spectroscopy (TERS) with IRIS
- Modular software and hardware for advanced experiments
Resources
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