The Most Complete TERS Solution for Nanoscale Spectroscopy
Product Overview
The Innova-IRIS is a fully integrated AFM-Raman spectroscopy platform designed to enable Tip-Enhanced Raman Spectroscopy (TERS) at the nanoscale. It seamlessly combines Bruker's high-resolution Innova AFM with the Renishaw inVia™ Raman microscope, delivering an industry-first solution for correlated chemical, topographical, electrical, and mechanical characterization—with nanometer resolution.
Purpose-built for opaque samples, Innova-IRIS features optimized off-axis optical access, stationary-tip scanning, and Bruker’s exclusive high-contrast TERS probes. With ultra-low drift, open geometry, and real-time coordination between Raman and AFM systems, the Innova-IRIS enables unparalleled nanospectroscopy, unlocking detailed chemical and structural analysis for materials, life sciences, semiconductors, and more.
Key Features
- Complete, Proven TERS System – Includes Bruker-exclusive high-contrast IRIS™ TERS probes for guaranteed performance
- Correlated AFM-Raman Imaging – Simultaneous nanoscale topography, modulus, and chemical mapping
- Optimized for Opaque Samples – Ideal front-side off-axis optical configuration for TERS alignment
- True Nanoscale Raman Spectroscopy – Achieve sub-10 nm spatial resolution with superior optical coupling
- Innova AFM Reliability – Closed-loop positioning, ultra-low drift, open sample access
- Fully Integrated Control – Real-time coordination between AFM and Raman modules
- Flexible, Modular Design – Accommodates future upgrades and diverse experimental configurations
Specifications
| Feature | Specification |
|---|---|
| AFM System | Bruker Innova® with closed-loop scanning |
| TERS Probes | Bruker-exclusive high-contrast IRIS TERS probes |
| Raman Integration | Renishaw inVia™ (or Horiba LabRAM) compatibility |
| Optical Access | Front-side off-axis geometry (ideal for opaque samples) |
| Tip Alignment | Stationary-tip, sample-scanning design |
| AFM Modes | Contact, Tapping, Phase Imaging, LFM, KPFM, nanoTA, SThM, QNM |
| Raman Capabilities | Confocal micro-Raman with high-sensitivity detection |
| TERS Sensitivity | >100× Raman signal enhancement (e.g., Nile Blue, CVD graphene) |
| Software | Real-time integration module for coordinated AFM-Raman experiments |
| Applications | Materials science, graphene, semiconductors, polymers, strain/stress studies |
Applications
Semiconductor & Nanodevice Research
- TERS-based detection of strain and buried structures (e.g., silicon-on-insulator)
- Topographic and chemical property correlation in advanced node devices
- AFM-Raman failure analysis of nanostructures
Resources
Download Innova-Iris Brochures
Please complete the form and we will be in contact as soon as possible.