High-Performance Raman Spectroscopy for Advanced Material Analysis
Product Overview
The inVia Reflex is a research-grade confocal Raman microscope designed for high-sensitivity chemical analysis and imaging. It combines a high-performance spectrometer with a research-grade optical microscope, delivering exceptional spatial and spectral resolution. Its modular design allows for extensive customization, making it suitable for a wide range of applications in scientific research and industrial settings.
Key Features
- High Sensitivity and Spectral Resolution: Utilizes a stigmatic on-axis spectrometer design for excellent optical efficiency and stray light rejection, enabling detection of weak Raman signals and rapid analysis of minute material traces.
- Multiple Excitation Wavelengths: Supports various laser wavelengths (e.g., 514 nm, 785 nm) with interchangeable gratings (1200 l/mm and 2400 l/mm), allowing optimization for different sample types.
- Automated Features: Includes motorized XYZ stage for mapping and depth profiling, automated laser switching, and confocality control for high spatial resolution measurements.
- Advanced Software Control: Operated via WiRE software, providing comprehensive control over data acquisition, analysis, and visualization.
- Versatile Sample Viewing: Features stereo viewing, combined white light and laser video viewing, and automatic white light/Raman switching with data saving.
Specifications
| Category | Details |
|---|---|
| Laser Wavelengths | 514 nm, 785 nm |
| Gratings | 1200 l/mm, 2400 l/mm |
| Spectral Range | 130–3500 cm⁻¹ (typical for all laser lines); 5–4000 cm⁻¹ for 514 nm |
| Spectral Resolution | Approximately 1.0 cm⁻¹ |
| Objectives | 5x, 20x, 50x, 100x |
| Detector | Peltier-cooled CCD |
| Microscope | Research-grade Leica DM2700M with better than 2.5 µm depth resolution |
| Stage | Motorized XYZ stage with mapping and depth profiling capabilities |
| Software | WiRE for data acquisition and analysis |
| Sample Viewing | Stereo viewing, white light/laser video viewing, automatic switching |
Applications
Academia and Research Institutes
- Material Science: Characterization of crystalline structures, phase identification, and stress/strain analysis.
- Life Sciences: Non-destructive analysis of biological samples, including cells and tissues, for biochemical composition studies.
- Chemistry: Investigation of chemical reactions, compound identification, and molecular structure analysis.
Semiconductor Industry
- Wafer Analysis: Detection of stress, strain, and defects in semiconductor wafers.
- Thin Films: Characterization of thin film compositions and uniformity.
- Failure Analysis: Identification of contaminants and failure points in semiconductor devices.
Electrical & Electronic Materials
- Battery Research: Analysis of electrode materials and electrolyte compositions in batteries.
- Polymer Electronics: Study of conductive polymers and organic electronic materials.
- Nanotechnology: Characterization of nanomaterials and nanostructures for electronic applications.
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