Exceptional IR Spectroscopy Meets Ultrafast Imaging Performance
Product Overview
The LUMOS II is a fully integrated stand-alone FT-IR microscope offering unmatched performance, automation, and ease-of-use for routine and advanced microchemical analysis. With its cutting-edge ATR capabilities, optional focal plane array (FPA) detector, and the newly introduced ILIM IR laser imaging module, LUMOS II combines high-resolution IR spectroscopy with ultrafast chemical imaging.
Designed for fast failure analysis, quality control, and research across materials, life sciences, electronics, and more, the LUMOS II provides intuitive “point-and-shoot” operation while enabling deep analytical insight through high-quality IR imaging and spectroscopy—even in reflection and transmission modes.
Key Features
- Integrated, fully automated ATR objective with pressure control
- Ultrafast IR laser imaging (ILIM) module for rapid chemical imaging (4.5 mm²/s)
- Optional FPA detector for high-resolution FT-IR imaging (32×32 pixels at 5 µm pixel size)
- Wide spectral range coverage: full MIR for FT-IR; QCL-based speed for targeted analysis
- Motorized knife-edge apertures for precise region-of-interest selection
- Up to three detectors with fully automated switching (e.g., LN-MCT, DTGS)
- Open-access 270° design for large and complex samples (up to 4 cm high)
- OPUS software with AI-powered evaluation tools, 21 CFR Part 11 compliance
- Upgradeable and modular for growing laboratory needs
Specifications
| Feature | Specification |
|---|---|
| Spectroscopy Modes | ATR, Transmission (TRANS), Reflection (REFL) |
| IR Laser Imaging Speed (ILIM) | >4.5 mm²/s (single wavenumber), 1.1 mm²/s (MIR range) |
| FT-IR Imaging (FPA) | 32 × 32 pixels, 1.6 mm²/min at 5 µm resolution |
| Spectral Range | Full MIR range (1800–950 cm⁻¹); QCL options |
| Sample Size Capacity | Up to 4 cm height; 3 cm extra working distance |
| Working Area | Field of View up to 2.21 mm × 2.04 mm (ILIM) |
| ATR Objective | Motorized, integrated; 1.25 µm imaging resolution |
| Optics | ZnSe (no purge required); optimized for MCT detectors |
| Automation | Motorized switching (detectors, apertures, modes) |
| Software | OPUS with AI analysis, compliance, batch processing |
| Imaging Modes | IR laser imaging (ILIM), FT-IR FPA imaging, point mapping |
Applications
Electronics & Semiconductor
- Organic/inorganic defect analysis in chips and wafers
- Root cause identification in photomasks, contacts, and coatings
- Chemical imaging for failure analysis
Plastics & Polymer Science
- Chemical composition of composites, laminates, multilayers
- Characterization of aging, inclusions, and inhomogeneities
- Surface and cross-section mapping of polymer blends
Coatings & Surface Analysis
- Homogeneity and integrity checks of DLC, polymer, and oxide layers
- Detection of thin residues, smears, and contaminants
- Surface mapping in REFL and ATR
Forensics & Microcontaminants
- Paint chip, fiber, and gunshot residue analysis
- Particle identification and trace material classification
- Non-destructive evidence analysis in embedded samples
Environmental & Microplastics
- Microplastic identification on filters and complex matrices
- Chemical mapping of particles and fibers
- Automated particle detection and cataloging
Resources
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