The Benchmark for High-Performance Atomic Force Microscopy
Product Overview
The MultiMode 8-HR is the world-renowned standard for high-resolution AFM imaging and quantitative nanomechanical characterization. The 8-HR introduces advanced capabilities like high-speed PeakForce Tapping®, PeakForce QNM®, FastForce Volume™, and high-frequency nanomechanical mapping. It excels in biological, materials, and nanoelectronic research, offering unmatched versatility, reliability, and customizability.
From atomic-scale imaging to precise property mapping, MultiMode 8-HR provides unparalleled performance across environments, including air, liquid, controlled atmosphere, and glovebox applications. Designed with open architecture and full data access, it allows researchers to customize, innovate, and push the limits of nanoscale science.
Key Features
- Complete PeakForce Tapping® & PeakForce QNM® imaging and property mapping
- FastForce Volume™ and 4 kHz frequency modulation for dynamic nanomechanical analysis
- Quantitative electrical modes: PeakForce KPFM™, TUNA™, CAFM, EFM, and more
- Supports STM, EC-AFM, fluid imaging, and advanced environmental controls
- NanoScope® Open Access Toolbox for custom scripting, signal monitoring, and data export
- Temperature control from -35°C to 250°C with purge and glovebox compatibility
- Sub-30 pm Z-noise for atomic/molecular resolution across biological and hard materials
- Turnkey glovebox solution for oxygen/moisture-sensitive materials
Specifications
| Feature | Specification |
|---|---|
| Z Noise Level | <30 pm RMS in TappingMode |
| Sample Size | Up to 15 mm diameter, 5 mm thick |
| Imaging Modes | PeakForce Tapping™, QNM®, TUNA™, KPFM™, TappingMode™, Contact, Phase, LFM, STM |
| Mechanical Mapping | PeakForce QNM, FastForce Volume, Force Modulation, Nanoindentation |
| Electrical Modes | PeakForce KPFM, TUNA, CAFM, EFM, SCM, SSRM |
| Thermal Modes | Scanning Thermal Microscopy, Nano Thermal Analysis (−35°C to 250°C) |
| Environmental Options | Atmospheric chamber, glovebox (<1 ppm), liquid cell, heater/cooler |
| Software & Access | NanoScope Open Toolbox, MATLAB export, COM scripting |
| Certification | CE and UKCA certified |
| Laser | Class 2M, 1 mW max at 690 nm |
Applications
Materials Science
- Topography and modulus mapping in polymers and composites
- Phase transition and structural studies
- Interface analysis in multilayer materials
Semiconductors & Nanoelectronics
- Surface potential and work function analysis
- Conductive mapping on fragile nanodevices
- Electrical and mechanical defect localization
Energy & Electrochemistry
- Battery material analysis in controlled environments
- ECSTM and SECPM mapping
- Solar material surface mapping and conductivity
Resources
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