Precision, Speed, and Flexibility in One BioAFM System
Product Overview
The NanoWizard 4 XP BioScience AFM offers a unique combination of high-resolution imaging, fast scanning, and a wide scan range in a single integrated platform. Designed for long-term, live-cell and material analysis, it provides unmatched optical integration, enabling simultaneous AFM and advanced microscopy on inverted or upright setups. Whether in biological, semiconductor, or nanotechnology research, the system ensures reliable, quantitative data acquisition for both soft and structured surfaces.
Key Features
- High-resolution, low-noise scanning with atomic lattice resolution, even on inverted microscopes
- Fast scanning option up to 150 lines/sec for real-time dynamics
- PeakForce Tapping for non-destructive imaging and mechanical mapping
- Integrated NestedScanner for corrugated or high-topography samples
- Workflow-based V7 software with experiment planning and automated calibration
- Optical integration with super-resolution platforms like STED, SIM, PALM/STORM
- Advanced automation for unattended experiments and large-area mapping
- Remote monitoring and control through ExperimentControl interface
Specifications
| Category | Details |
|---|---|
| Scan Range | 100 × 100 × 15 µm³, with 1.5 µm additional Z-range (high-speed mode) |
| Resolution & Noise | < 0.03 nm RMS in Z (closed-loop), < 0.09 nm RMS XY sensor noise |
| Max Scan Speed | Up to 150 lines/sec |
| Controller | Vortis 2 with high-bandwidth and 8 MHz signal capture |
| Detector Sensitivity | < 2 pm RMS (0.1 Hz–1 kHz bandwidth) |
| Operating Modes | PeakForce Tapping, TappingMode, Contact, LFM, Force Mapping, SMFS, SCFS |
| Optional Modes | Conductive AFM, Piezoresponse, Electrochemistry, Nanoindentation, FluidFM |
| Optical Compatibility | Inverted & upright microscopes from Zeiss, Nikon, Olympus, Leica |
| Software | V7 SPMControl with DirectOverlay 2, RampDesigner, ExperimentPlanner |
| Environmental Control | Temperature, gas, humidity, and liquid control with full compatibility |
| Automation | MultiScan, HybridStage, Motorized Mapping, Optical Tiling |
| Sample Holders | Supports Petri dishes, slides, SPM discs; up to Ø140 mm × 18 mm volume |
Applications
Academia and Research Institutes
- Real-time cell dynamics and mechanobiology under physiological conditions
- Force spectroscopy and adhesion studies for protein folding, DNA/RNA mechanics
- Correlated AFM-optical imaging in multi-user imaging facilities
Semiconductor Industry
- Surface topography and mechanical property mapping of thin films and wafers
- High-resolution defect localization and nanostructure characterization
- Quantitative modulus mapping of lithography and packaging layers
Electrical & Electronic Materials
- Mechanical and electrical performance studies of MEMS/NEMS devices
- Conductive and piezoresponsive imaging of polymers, composites, and dielectrics
- Nano-indentation and viscoelasticity testing on flexible electronics and sensors
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