Advanced Integration of AFM with Optical and Spectroscopic Techniques
Product Overview
The NanoWizard NanoOptics AFM from Bruker JPK is a premier platform for integrating Atomic Force Microscopy (AFM) with advanced optical methods, including Raman spectroscopy, Tip-Enhanced Raman Spectroscopy (TERS), fluorescence, sSNOM, and SNOM. Purpose-built for nanoscale photonic and spectroscopic analysis, it delivers high-resolution imaging, precise positioning, and unmatched flexibility across air and liquid environments.
With support for a wide range of commercial inverted optical microscopes and spectrometers, the system enables synchronized acquisition of topographic and optical data at the nanometer scale. Designed with closed-loop control, low drift, and multi-axis scanning (tip and sample), it is ideal for both academic research and applied material science.
Key Features
- Complete AFM integration with Raman, fluorescence, and scattering-type SNOM (sSNOM)
- Tip and sample scanning design for perfect optical axis alignment
- 980 nm IR deflection laser eliminates interference in optical measurements
- High mechanical and thermal stability for long-term BioTERS and photon counting applications
- Integrated ports for fiber SNOM and advanced light detection
- Seamless DirectOverlay™ software for correlated AFM-optics data acquisition
- Compatible with inverted research microscopes (Zeiss, Nikon, Olympus, Leica)
- Vortis™ Advanced controller with ultra-low noise, multiple signal channels, and open scripting access
- Ideal for use with coverslips in air, gas, or liquid environments
Specifications
| Feature | Specification |
|---|---|
| Scan Range (Closed-loop) | 100 × 100 × 15 µm³ |
| Positioning Noise | <0.15 nm (XY), <0.06 nm (Z sensor) |
| Z Noise Level | <0.03 nm RMS |
| Deflection Laser | 980 nm IR, interference-free detection |
| Scanning Configuration | 3 axes tip + 2/3 axes sample (TAO™ module) |
| Operating Environments | Air, gas, and fully liquid-compatible design |
| Integrated Ports | Fiber SNOM, fluorescence, TERS reflectors |
| Microscope Compatibility | Zeiss, Nikon, Olympus, Leica (inverted) |
| SPM Controller | Vortis™ Advanced with 60 MHz ADC, lock-in, and photon counting |
| Optical Modes | TERS, Raman, Fluorescence, FRET, TIRF, Confocal, STED, sSNOM, SNOM |
| Software | JPK SPMControl with DirectOverlay™, QI™, and SmartMapping |
Applications
Materials Science & Nanophotonics
- Characterization of quantum dots, nanoantennas, and photonic structures
- Topography and optical property correlation in 2D materials and metamaterials
- Scattering-type SNOM of nonlinear effects, plasmonics, and optical quenching
Semiconductor & Nanoelectronics
- Surface potential and composition analysis via TERS and KPFM
- High-resolution mapping of strain, doping, and electrical/magnetic domains
- Optical and topographical correlation in thin films and MEMS devices
Resources
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