Next-Generation High-Speed AFM with Optical Integration
Product Overview
The NanoWizard ULTRA Speed 3 is a state-of-the-art atomic force microscope (AFM) that delivers high-speed, high-resolution scanning for real-time analysis of biological, semiconductor, and nanomaterials. Capable of scanning up to 1,400 lines per second, it supports automated workflows, advanced optical integration, and quantitative nanomechanical measurements with nanometer precision.
Tailored for multi-user environments, imaging facilities, and interdisciplinary labs, ULTRA Speed 3 seamlessly combines speed, sensitivity, and automation—enabling researchers to explore nanoscale dynamics, materials properties, and structural behavior with minimal user input and maximum throughput.
Key Features
- Scanning speeds up to 1,400 lines/sec for high-throughput, real-time dynamic imaging
- Automated alignment, calibration, and parameter optimization via DynAsyst
- Full integration with advanced optical techniques: confocal, super-resolution, fluorescence, and Raman
- Multi-user support with intuitive software and customizable workflows
- Nanomechanical analysis with optional modes: PeakForce Tapping®, QI Advanced, PeakForce QNM®, and more
- ExperimentPlanner and ExperimentControl for automated long-term and remote experiments
- NestedScanner and SmartMapping for fast microrheology and ROI-based force mapping
- Environmental and temperature control for real-time observation under varied conditions
- Largest accessory ecosystem for optical, electrochemical, and mechanical extensions
- Integrated Vortis 2.2 controller with real-time signal processing and low-noise DACs
Specifications
| Specification | Details |
|---|---|
| Max Scan Speed | 1,400 lines/sec (FastImaging) |
| Scan Range (XYZ) | 30 × 30 × 6.5 µm³ (+1.5 µm Z extension) |
| Resolution | Atomic resolution in liquid and air |
| Control System | Vortis 2.2 SPM Controller with FPGA processing and 3D acceleration sensor |
| Cantilever Alignment | Fully automated, with QR-code pre-calibrated probe scanning |
| Sample Stages | Motorized or manual precision stage, 20 × 20 mm² range |
| Software Platform | V8.1 SPMControl with multi-user workflow and advanced batch processing |
| Standard Modes | TappingMode™, Contact Mode, Force Spectroscopy, PeakForce QI, FastImaging |
| Optional Modes | PeakForce Tapping, PFM, MFM, Conductive AFM, Kelvin Probe, Microrheology |
| Optical Integration | Confocal, STED, PALM/STORM, TIRF, SIM, IRM, fluorescence, upright optics |
| Compatible Systems | Zeiss, Nikon, Olympus, Leica inverted and upright microscopes |
| Environment Controls | Heating (up to +300°C), Cooling (down to -120°C), humidity, perfusion |
Applications
Academia & Research Institutions
- Real-time imaging of protein folding, ligand-receptor interactions, and enzymatic reactions
- Mechanical property analysis of single molecules, cells, and soft matter
- Integration with advanced fluorescence or confocal imaging for correlative analysis
Semiconductor & Electronics
- Nanoscale topography and roughness analysis of dielectric layers, thin films, and pattern structures
- Defect analysis and nanomechanical evaluation of lithographic and MEMS components
- Combined electrochemical AFM and surface mapping for device development
Electrical & Electronic Materials
- High-resolution inspection of conductive polymers, nanowires, and graphene structures
- Force mapping and phase imaging of composite materials and heterostructures
- Performance testing of thin coatings, adhesives, and encapsulants under mechanical stress
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