Next-Gen BioAFM for Quantitative Imaging
Product Overview
The NanoWizard V BioScience AFM is Bruker’s most advanced BioAFM system, built for researchers demanding quantitative, nanomechanical, and high-resolution imaging in biology and life sciences. Integrating seamlessly with inverted and upright optical microscopes, the system supports live-cell measurements, protein unfolding, force spectroscopy, and mechanobiology in real time and under physiological conditions.
With its automated workflows, nested scanner design, and PeakForce-QI mode, the system delivers fast, reproducible, and artifact-free results—ideal for applications ranging from tissue engineering to cellular mechanics and infection biology.
Key Features
- High-Speed Nanomechanical Imaging: Scan rates up to 400 lines/sec with PeakForce-QI and nested scanner technologies.
- Automated & Intuitive: Auto-alignment, one-click cantilever and optical calibration, and guided experiment planning via SPM V8 software.
- Correlated Optical + AFM: Combine with phase contrast, DIC, TIRF, STED, and confocal microscopy using DirectOverlay 2.
- Physiological Control: Perform experiments in controlled environments (temperature, CO₂, humidity) using a range of compatible accessories.
- Multimodal Operation: From stiffness and elasticity to molecular binding and viscoelastic mapping—tailored for soft, living, or delicate samples.
- Long-Term, Remote Experiments: Remote operation and ExperimentPlanner enable fully unattended, long-duration data acquisition and force mapping.
Specifications
| Category | NanoWizard V BioScience |
|---|---|
| Scan Range | 100 × 100 × 15 µm³ + additional 1.5 µm Z-range (with PeakForce-QI) |
| Max Line Rate | Up to 400 lines/sec |
| Controller | Vortis 2.1 SPM Controller |
| Microscope Integration | Zeiss, Nikon, Olympus, Leica (inverted & upright) |
| Stage Options | Motorized or manual precision stage (20 mm × 20 mm travel), Head-Up stage (14 cm Z range) |
| Optical Compatibility | Brightfield, DIC, Phase Contrast, Confocal, FLIM, TIRF, FRAP, STED, STORM, SIM |
| Standard Modes | PeakForce-QI, QI, TappingMode™, Contact, Lateral Force, Advanced Force Mapping |
| Optional Modes | SCFS, SMFS, Microrheology, Kelvin Probe, Piezoresponse, Conductive AFM, STM, Lithography |
| Environmental Control | Liquid, gas, temperature, and humidity control; BSL-3 compliant setups |
| Data Processing | Full batch analysis: WLC, JKR, DMT, FFT, edge detection, contour maps, 3D rendering |
| Software | SPM V8 with DirectOverlay 2, ExperimentPlanner, and true multi-user architecture |
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