High-Precision Measuring Microscope for Industrial Applications
Product Overview
The STM7 Industrial Measuring Microscope is a versatile and high-precision measuring microscope designed for industrial inspection, quality control, and research applications. Engineered to provide accurate 3-axis measurements, the STM7 series is ideal for semiconductor, electronics, automotive, aerospace, and precision manufacturing industries.
Equipped with UIS2 infinity-corrected optics, advanced autofocus technology, and measurement support software, the STM7 ensures repeatable and reliable dimensional analysis of complex components. With its granite-based structure for vibration resistance, the STM7 provides exceptional stability for submicron measurements, making it a trusted solution for high-precision metrology.
Key Features
- 3-Axis Measurement Capability – Accurately measures dimensions along X, Y, and Z axes with submicron precision.
- Wide Measurement Range – Stage options available in 100 × 100 mm, 200 × 200 mm, and 300 × 300 mm configurations.
- Autofocus & Focus Navigator – Reflective confocal autofocus and focus navigation system for precise height measurement.
- High-Resolution Optical System – UIS2 optics provide high-contrast, distortion-free imaging.
- Multiple Illumination Methods – Brightfield, Darkfield, DIC, and Polarized light for enhanced sample observation.
- Granite Stage Mounting – Minimizes vibrations and ensures long-term measurement accuracy.
- Light Intensity Manager – Automatically adjusts brightness when switching objectives for consistent observations.
- Measurement Support Software – Automated edge detection, image stitching (MIA), and extended focus imaging (EFI).
- Digital Readout Display – Provides real-time measurement data in μm/mm/inch/mil for quick reference.
- Motorized & Manual Options – Choose from manual focusing models or motorized versions for automated workflows.
Specifications
| Feature | STM7-SF (100 mm Stage) | STM7-MF (200 mm Stage) | STM7-LF (300 mm Stage) |
|---|---|---|---|
| Optical System | UIS2 Infinity Optical System | UIS2 Infinity Optical System | UIS2 Infinity Optical System |
| Stage Size (X × Y) | 100 mm × 100 mm | 200 mm × 200 mm | 300 mm × 300 mm |
| Z-Axis Measurement Range | 120 mm (Measurement Obj.), 175 mm (Metallurgical Obj.) | 120 mm (Measurement Obj.), 175 mm (Metallurgical Obj.) | 120 mm (Measurement Obj.), 175 mm (Metallurgical Obj.) |
| Observation Methods | Brightfield, Darkfield, DIC, Polarized Light | Brightfield, Darkfield, DIC, Polarized Light | Brightfield, Darkfield, DIC, Polarized Light |
| Illumination System | White LED (Reflected), Green LED (Transmitted) | White LED (Reflected), Green LED (Transmitted) | White LED (Reflected), Green LED (Transmitted) |
| Focus Mechanism | Manual | Manual | Manual |
| Light Intensity Manager | Yes | Yes | Yes |
| Measurement Accuracy | (3 + 2L/100) μm | (3 + 4L/200) μm | (3 + 6L/300) μm |
| Digital Readout Unit | Yes | Yes | Yes |
| Anti-Vibration Design | Yes (Granite Stage) | Yes (Granite Stage) | Yes (Granite Stage) |
| Motorized Focus Option | Available in STM7-MFA | Available in STM7-MFA | Available in STM7-LFA |
| Weight | 84 kg | 152 kg | 277 kg |
Applications
- Wafer & IC Inspection – Precise measurement of silicon wafers, MEMS structures, and microfabricated components.
- PCB & Solder Joint Analysis – Evaluate circuit boards, solder bumps, and fine-pitch connectors.
- Microelectronics Metrology – Accurate measurement of thin-film layers, photomasks, and microcircuit layouts.
- Material & Surface Analysis – Inspect machined parts, coatings, and composite materials.
- Component Inspection – Evaluate wear, stress fractures, and microstructures in critical engine parts>.
- Weld & Bond Strength Testing – Measure seam dimensions and joint integrity in metal components.
- Micro-Machined Parts Inspection – Measure miniature gears, fine threads, and high-precision machined components.
- Tool & Die Quality Control – Analyze surface roughness, tool wear, and cutting edge geometries.
- Lens & Optical Component Testing – Ensure alignment and curvature accuracy in optical assemblies.
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