Unrivaled Flexibility and Spectral Resolution for Advanced Infrared Research
Product Overview
The VERTEX 80 and 80v represent the pinnacle of research-grade FT-IR spectroscopy. Built with Bruker’s patented UltraScan™ interferometer and equipped with true-aligned optics, these instruments offer optical resolution better than 0.06 cm⁻¹, extending the measurable spectral range from the terahertz (THz) and far IR through mid-IR, near-IR, visible, and into the UV.
The VERTEX 80 features a purgeable optics bench, while the VERTEX 80v introduces vacuum optics, eliminating atmospheric interference for the highest sensitivity in demanding applications. Both systems support full spectral range coverage, automated beamsplitter exchange, and parallel multi-channel data acquisition, making them ideal for high-resolution molecular studies, advanced material characterization, and time-resolved spectroscopy.
Key Features
- UltraScan™ true-aligned interferometer for ultimate precision
- Spectral resolution better than 0.06 cm⁻¹ — unmatched in its class
- Full spectral coverage from <5 cm⁻¹ (THz) to 50,000 cm⁻¹ (UV)
- Vacuum optics option (VERTEX 80v) eliminates H₂O/CO₂ interference
- Integrated automatic beamsplitter exchanger (BMS-c) for seamless range shifts
- Dual 24-bit ADC channels with DigiTect™ for highest dynamic range
- Modular with 5 output / 2 input ports for simultaneous accessory connections
- Compatible with external modules: verTera THz, HYPERION microscopy, FT-Raman, and more
- Built-in OPUS software with IQ/OQ/PQ support and 21 CFR Part 11 compliance
Specifications
| Feature | Specification |
|---|---|
| Spectral Range | 5 to 50,000 cm⁻¹ (THz to UV) |
| Spectral Resolution | <0.06 cm⁻¹ (apodized), standard <0.2 cm⁻¹ |
| Optics Bench | VERTEX 80: purgeable; VERTEX 80v: vacuum |
| Beam Ports | 5 outputs, 2 inputs (software selectable) |
| Detector Support | Up to 5 detectors (internal + external) |
| Beamsplitter Exchange | Motorized, vacuum-compatible (BMS-c, 4 positions) |
| Interferometer | UltraScan™ linear air-bearing with TrueAlignment™ |
| Sample Compartment | Large; vacuum-sealed option (80v) |
| Dual Channel ADC | 24-bit resolution, parallel operation |
| Software | OPUS software suite, IQ/OQ/PQ, BRAIN auto-recognition |
| Supported Modes | Rapid-scan, step-scan, slow-scan, modulation spectroscopy |
Applications
Semiconductors & Electronics
- High-resolution impurity analysis in silicon
- Low-temperature measurements with cryostats
- Dielectric and phonon mode studies in crystals
THz & Photonics
- Access spectral range below 10 cm⁻¹ with verTera extension
- Characterization of low-energy excitations and phonons
- Integration with bolometers and external THz detectors
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