Exceptional IR Spectroscopy Meets Ultrafast Imaging Performance
Product Overview
The VERTEX NEO R is vacuum FT-IR spectrometer, engineered to set new benchmarks in advanced research applications. Building upon decades of innovation, it integrates cutting-edge technologies like the full-vacuum ATR accessory, MultiTect™ detector system, and interleaved time-resolved spectroscopy (TRS). This platform offers unparalleled sensitivity, flexibility, and stability, making it ideal for high-end research in fields such as catalysis, battery development, and semiconductor analysis.
Key Features
- Full-vacuum optics for maximum stability and sensitivity
- Unique vacuum ATR with accessible sample stage for easy handling
- RockSolid™ interferometer with aluminum-coated optics and 30° incidence for efficiency
- MultiTect™ system supporting up to 5 detectors; DigiTect™ for specialized detectors
- Ample space for MCTs with 12–24 h holding time (optional cover)
- Dual-channel 24-bit ADC for fully digitized signal processing
- Easy upgrades for near IR, far IR, and VIS/UV ranges
- Touch panel with OPUS TOUCH software for intuitive and advanced R&D workflows
- Software-selectable beam ports (5 exit and 2 input)
- Advanced TRS scanning modes including Rapid, Slow, Step, and Interleaved
- THz extension with a separated optical path
- Compatibility with VERTEX and INVENIO modules and accessories
- Large compartment for bulky accessories
- LED light bar indicating instrument status
Specifications
| Feature | Specification |
|---|---|
| Optical Design | Full-vacuum optics with RockSolid™ interferometer |
| ATR Accessory | Unique vacuum ATR with accessible sample stage |
| Detector Support | MultiTect™ system (up to 5 detectors); DigiTect™ for specialized detectors |
| Data Acquisition | Dual-channel 24-bit ADC; advanced TRS scanning modes |
| Software Interface | OPUS TOUCH with intuitive R&D workflows |
| Beam Ports | 5 exit and 2 input, software-selectable |
| Spectral Range | Expandable to near IR, far IR, and VIS/UV |
| THz Extension | Integrated with separated optical path |
| Sample Compartment | Large, accommodating bulky accessories |
| Status Indicator | LED light bar for instrument status |
Applications
Battery & Energy Storage
- Characterization of electrode materials
- Investigation of electrolyte stability
- In-situ monitoring of charge-discharge cycles
Semiconductor & Electronics
- Analysis of thin films and multilayer structures
- Detection of impurities and defects
- Evaluation of material properties under various conditions
Talk to us
Please complete the form and we will be in contact as soon as possible.