Revolutionizing Electronics through Advancements and Innovations
Embedded in our daily lives, the electronics market is a bustling realm of innovation and connectivity. From the devices we use to the systems that drive industries, this dynamic market drives technological evolution. With its rapid pace of change, it shapes how we communicate, work, and navigate the modern world, ushering in a future powered by endless possibilities
Advanced Imaging Equipment
Detect flaws and defects in objects (e.g. samples) through ultrasound
A desktop version of the electron microscope, equipped with a simplified user interface and design as compared to the electron microscope.
Detect flaws and defects in objects (e.g. samples) through X-rays.
The X-platform series is a dedicated high speed inline automated X-ray inspection system for the inspection of PCB-assembly boards for single/multipanels or samples in trays. The system offers market leading inspection speed and is ideal for low-mix high-volume production environment.
An automated version of X-ray inspection equipment with enhanced process automation features, including automated anomaly detection function.
State-of-the-art automated optical, microelectronics, conformal coat and solder paste inspection systems provide our customers with fast, accurate inspection they can count on.
Optical & Portable Equipment
An optical instrument that uses a combination of lenses to produce magnified image for quality inspection and analysis of samples.
To perform elemental analysis on samples through X-ray fluorescence.
Coating Thickness, Elemental Analysis & RoHS Inspection Using X-Ray Fluorescence Analyzer.
Advanced Analytical & Testing Equipment
Accurate and comprehensively equipped test system capable of measuring down to 0.001mN.
To analyse a sample's surface elemental composition and chemical bonding state through X-ray photoelectrons.
State of the art deformation or warpage measurement system for devices under thermal stress evaluation ideal for research development, quality and reliability, process development, and failure analysis studies.
To perform electrical characterisation of microelectronic devices, in situ semiconductor failure analysis and manipulation of single structures under an electron, ion and/or optical microscopes.
To obtain high-resolution images to measure and visualise materials at an atomic and nano scale.
Sample Management Equipment
To remove the moulding compound of E&E components to expose the integrated circuit ("IC") chips and dies within, which then allows users to inspect and identify any defects in the IC chips and dies.
Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques.
To precisely and consistently dispense the required amount of fluids into the micron-sized gaps present between IC chips and components on the printed circuit board, thereby facilitating electrical interconnect, providing structural integrity and ensuring optimal heat transfer for reliable performance.
Plasma treatment systems suit various plasma cleaning, surface activation, and adhesion improvement applications. The systems deliver exceptionally uniform plasma cleaning and treatment.
Plasma treatment systems offer high-throughput, strip-type, and inline boat processing for advanced semiconductor packaging applications.
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